@article{DechantSeligerKennel2019, author = {Eduard Dechant and Norbert Seliger and Ralph Kennel}, title = {Power cycling and temperature endurance test of a GaN switching cell with substrate integrated chips}, journal = {Microelectronics Reliability}, volume = {100-101}, pages = {113372}, url = {https://doi.org/10.1016/j.microrel.2019.06.064}, year = {2019}, }