TY - CONF A1 - Slade, Holly C. A1 - Shur, M.S. A1 - Deane, S.C. A1 - Hack, M. T1 - Amorphous Silicon TFTs: Material Characterization, Device Operation, and Bias Stress Modeling T2 - The Electrochemical Society Extended Abstracts KW - Thin Film Transistors Y1 - 2020 UR - https://opus4.kobv.de/opus4-rosenheim/frontdoor/index/index/docId/1594 VL - 95 IS - 2 SP - 861 ER -