TY - CONF A1 - Schemme, Michael A1 - Ehrenstein, Gottfried Wilhelm T1 - Quality Assurance and Regularity of SMC-Materials T2 - Tagungsband 50th SPI Conference KW - FVK Y1 - 1995 UR - https://opus4.kobv.de/opus4-rosenheim/frontdoor/index/index/docId/1556 CY - Cincinnati ER -