@article{CastellazziKrausSeligeretal.2002, author = {A. Castellazzi and R. Kraus and Norbert Seliger and D. Schmitt-Landsiedel}, title = {Reliability analysis of power MOSFET's with the help of compact models and circuit simulation}, journal = {Microelectronics Reliability}, volume = {42}, number = {9}, pages = {1605 -- 1610}, doi = {10.1016/S0026-2714(02)00198-1}, year = {2002}, }