TY - JOUR A1 - Kanert, W. A1 - Dettmer, H. A1 - Plikat, B. A1 - Seliger, Norbert T1 - Reliability aspects of semiconductor devices in high temperature applications T2 - Microelectronics Reliability Y1 - 2023 UR - https://opus4.kobv.de/opus4-rosenheim/frontdoor/index/index/docId/2226 SN - 0026-2714 VL - 43 IS - 9 SP - 1839 EP - 1846 ER -