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In this paper, the results of Thermally Stimulated Depolarization Currents (TSDC)-measurements of a complex system of stacked dielectric layers, like typically appearing in semiconductor packages, is presented. Characteristics of the individual isolation layers are presented solely and the results are compared to the stack. The investigated layers are comprising polyimide film, alkali-free glass, polyolefin film and epoxy based mold compound. Measurements have been carried out in the temperature range from 19 - 195°C at varying polarization fields for every material. Various relaxation peaks, originated by different polarization mechanisms within the materials could be observed. A comparison between the TSDC-peaks of the layer stack and the individual materials is shown. Our results demonstrate, that the super positioned spectrum is getting dominated by a single portion, the mold compound.
A method of referencing in an extrinsic optical fiber sensor system utilizing temperature dependence of the absorption edge in a semiconductor crystal (semi-insulating iron-doped indium phosphide) is demonstrated. The intensity reference is provided by controlling the temperature of an LED source and transmission measurements with different emission spectra. A transient operation regime is introduced. The entire process is controlled by a microprocessor unit. The performance of the sensor system is investigated and it is shown that the connector losses may be compensated for. Contrary to the published works performed with GaAs crystals it was not observed that the absorption coefficient of the semiconductor follows the law for idealized direct-gap semiconductor but can be described by the so-called Urbach tail. Since the proposed sensor system comprises a single LED source, simple electronics and no optical fiber couplers it is promising for realization of low-cost fiber-optic temperature sensors, e.g. for power transformer monitoring or magnetic resonance imaging applications.
Optical fiber sensors based on intensity measurement require some form of intensity referencing to avoid errors arising from parasitic losses. Known techniques of referencing such as balanced bridge, divided beam systems or two-wavelength referencing are not suitable for low-cost applications since they use relatively complicated optical components such as multiple LED sources, couplers, filters etc. In this work a novel method of referencing in an extrinsic optical fiber sensor system utilizing temperature dependence of absorption edge in a semiconductor crystal is described. The sensor system comprises a single LED source and no optical fiber junctions. The emission spectrum of an LED depends on its temperature. The reference is provided by controlling the temperature of an LED source and transmission measurements with different emission spectra. The entire process is controlled by a microprocessor unit. Performance of a sensor system is investigated and it is shown that the losses in connectors may be compensated for.