Refine
Year of publication
- 2021 (1)
Document Type
Language
- English (1)
Has Fulltext
- no (1)
Is part of the Bibliography
- no (1)
Institute
Begutachtungsstatus
- peer-reviewed (1)
A current dependent performance test is used to investigate the influence of doping and emitter geometry on the lifetime of silicon field emitter arrays. The measurements reveal an improved performance for lower n-type dopant concentrations. Furthermore, two new types of field emitters are introduced by slightly varying the original fabrication process [1]. The comparison shows superiority of tip like emitters over blade like structures.