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Time-resolved x-ray diffraction study of ultrafast acoustic phonon dynamics in Ge/Si-heterostructures

  • Using time-resolved x-ray diffraction the ultafast strain dynamics in fs-laserexcited Ge/Si-heterostructures has been studied. A fluence dependent, anharmonic damping of the impulsively generated acoustic phonons and vibrational transport across the buried Ge/Si-interface are observed.

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Metadaten
Author:Klaus Sokolowski-Tinten, Andrea Cavalleri, C. W. Siders, F. L. H. Brown, D. M. Leitner, Csaba Tóth, Martin KammlerORCiDGND, Michael Horn-von Hoegen, D. von der Linde, Jeff A. Squier, C. P. J. Barty, K. R. Wilson
DOI:https://doi.org/10.1007/978-3-642-56546-5_81
Parent Title (English):Chemical Physics
Publisher:Springer
Document Type:Article
Language:English
Year of first Publication:2001
Release Date:2022/07/15
Volume:66
First Page:281
Last Page:283
Institutes:Fakultät Angewandte Natur- und Kulturwissenschaften
Fakultät Angewandte Natur- und Kulturwissenschaften / Labor Nanoanalytik und Halbleiterchemie (Nanochem)
Publication:Externe Publikationen
research focus:Produktion und Systeme
Licence (German):Keine Lizenz - Es gilt das deutsche Urheberrecht: § 53 UrhG