Time-resolved x-ray diffraction study of ultrafast acoustic phonon dynamics in Ge/Si-heterostructures
- Using time-resolved x-ray diffraction the ultafast strain dynamics in fs-laserexcited Ge/Si-heterostructures has been studied. A fluence dependent, anharmonic damping of the impulsively generated acoustic phonons and vibrational transport across the buried Ge/Si-interface are observed.
Author: | Klaus Sokolowski-Tinten, Andrea Cavalleri, C. W. Siders, F. L. H. Brown, D. M. Leitner, Csaba Tóth, Martin KammlerORCiDGND, Michael Horn-von Hoegen, D. von der Linde, Jeff A. Squier, C. P. J. Barty, K. R. Wilson |
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DOI: | https://doi.org/10.1007/978-3-642-56546-5_81 |
Parent Title (English): | Chemical Physics |
Publisher: | Springer |
Document Type: | Article |
Language: | English |
Year of first Publication: | 2001 |
Release Date: | 2022/07/15 |
Volume: | 66 |
First Page: | 281 |
Last Page: | 283 |
Institutes: | Fakultät Angewandte Natur- und Kulturwissenschaften |
Fakultät Angewandte Natur- und Kulturwissenschaften / Labor Nanoanalytik und Halbleiterchemie (Nanochem) | |
Publication: | Externe Publikationen |
research focus: | Produktion und Systeme |
Licence (German): | Keine Lizenz - Es gilt das deutsche Urheberrecht: § 53 UrhG |