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High aspect ratio silicon tip cathodes for application in field emission electron sources
- Precisely aligned arrays of sharp tip structures on top of elongated pillars were realized by using an improved fabrication process including an additional inductively-coupled-plasma reactive-ion etching step. Arrays of n-type and p-type silicon with 271 tips have been fabricated and investigated. Those structures have a total height of 5–6 µm and apex radii less than 20nm. Integral field emission measurements of the arrays yielded low onset-fields in the range of 8–12V=µm and field enhancement factors between 300 and 700. The I-E curves of n-type structures showed the usual Fowler-Nordheim behaviour, whereas p-type structures revealed a significant saturation region due to the limited number of electrons in the conduction band and a further carrier depletion effect caused by the pillar. The maximum integral current in the saturation region was 150 nA at fields above 30V=µm. An excellent stability of the emission current of less than ± 2% fluctuation was observed in the saturation region. For n-type Si a maximum integral current of 10 µA at 24V=µm and an average current stability with a fluctuation of ± 50% were measured.
Author: | Christoph LangerORCiD, Robert Damian ŁawrowskiORCiD, Christian PrommesbergerORCiD, Florian Dams, Pavel Serbun, Michael BachmannORCiD, Günter Müller, Rupert SchreinerORCiDGND |
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DOI: | https://doi.org/10.1109/IVNC.2014.6894824 |
Parent Title (English): | 2014 27th International Vacuum Nanoelectronics Conference (IVNC), 6-10 July 2014, Engelberg, Switzerland |
Publisher: | IEEE |
Document Type: | conference proceeding (article) |
Language: | English |
Year of first Publication: | 2014 |
Release Date: | 2022/05/26 |
Tag: | Current measurement; Etching; FABRICATION; GEOMETRY; Iron; Sensor arrays; field emission; field emitter array; silicon; silicon tip |
First Page: | 222 |
Last Page: | 223 |
Institutes: | Fakultät Angewandte Natur- und Kulturwissenschaften |
Fakultät Angewandte Natur- und Kulturwissenschaften / Labor Mikrosensorik | |
Begutachtungsstatus: | peer-reviewed |
research focus: | Sensorik |
Licence (German): | Keine Lizenz - Es gilt das deutsche Urheberrecht: § 53 UrhG |