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Extraction of the characteristics of current-limiting elements from field emission measurement data

  • In this contribution, the authors will present an algorithm to extract the characteristics of nonideal field emission circuit elements from saturation-limited field emission measurement data. The method for calculating the voltage drop on current-limiting circuit elements is based on circuit theory as well as Newton's method. Since the only assumption the authors make on the current-limiting circuit is a connection in series, this method is applicable to most field emission data showing saturation. To be able to determine the significance of any parameter output, the uncertainties of data and extracted parameters as well as the parameter correlations are fully taken into account throughout the algorithm. N-type silicon samples with varying external serial resistors are analyzed. All results show a good agreement to the nominal resistor values. Additionally, several p-type samples are analyzed, showing a diodelike behavior. The extracted current-limiting characteristics of the p-type samples are in good agreement with a pn-junction model. The stability of the emission current of the p-type samples is measured by constant voltage measurements and compared to the extracted current-limiting characteristics. The application of the algorithm to measurement data shows that the given algorithm is a valuable tool to analyze field emission measurement data influenced by nonemissive processes.

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Metadaten
Author:Michael BachmannORCiD, Florian Dams, Felix Düsberg, Martin Hofmann, Andreas Pahlke, Christoph LangerORCiD, Robert Damian ŁawrowskiORCiD, Christian PrommesbergerORCiD, Rupert SchreinerORCiDGND, Pavel Serbun, Dirk Lützenkirchen-HechtORCiD, Günter Müller
DOI:https://doi.org/10.1116/1.4971768
Parent Title (English):Journal of Vacuum Science & Technology B
Document Type:Article
Language:English
Year of first Publication:2017
Release Date:2021/05/06
Volume:35
Issue:2
Article Number:02C103
Institutes:Fakultät Angewandte Natur- und Kulturwissenschaften
Fakultät Angewandte Natur- und Kulturwissenschaften / Labor Mikrosensorik
Begutachtungsstatus:peer-reviewed
research focus:Sensorik
Licence (German):Keine Lizenz - Es gilt das deutsche Urheberrecht: § 53 UrhG