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In situ quantitative field emission imaging using a low-cost CMOS imaging sensor

  • Spatially resolved field emission measurements represent an important factor in further development of existing field emitter concepts. In this work, we present a novel approach that allows quantitative analysis of individual emission spots from integral current-voltage measurements using a low-cost and commercially available CMOS camera. By combining different exposure times to extrapolate oversaturated and underexposed pixels, a near congruence of integral current and image brightness is shown. The extrapolation also allows parallel investigation of all individual tips participating in the total current with currents ranging from a few nanoampere to one microampere per tip. The sensitivity, which is determined by the integral brightness-to-current ratio, remains unchanged within the measurement accuracy even after ten full measurement cycles. Using a point detection algorithm, the proportional current load of each individual tip of the field emitter array is analyzed and compared at different times during the initial measurement cycle. Together with the extracted I-V curves of single emission spots from the integral measurement, the results indicate the effect of premature burnout of particularly sharp tips during conditioning of the emitter.

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Metadaten
Author:Andreas SchelsORCiD, Simon EdlerORCiD, Florian HerdlORCiD, Walter Hansch, Michael BachmannORCiD, Daniela Ritter, Markus Dudeck, Felix Duesberg, Manuel Meyer, Andreas Pahlke, Matthias HausladenORCiD, Philipp Buchner, Rupert SchreinerORCiDGND
DOI:https://doi.org/10.1116/6.0001551
Parent Title (English):Journal of Vacuum Science & Technology B
Publisher:AIP Publishing
Document Type:Article
Language:English
Year of first Publication:2022
Release Date:2022/02/03
Tag:ARRAYS; ELECTRON-EMISSION; EMITTERS; FakANK
Volume:40
Issue:1
Article Number:014202
Institutes:Fakultät Angewandte Natur- und Kulturwissenschaften
Fakultät Angewandte Natur- und Kulturwissenschaften / Labor Mikrosensorik
Begutachtungsstatus:peer-reviewed
research focus:Sensorik
Licence (German):Keine Lizenz - Es gilt das deutsche Urheberrecht: § 53 UrhG