MetadatenAuthor: | Victor I. Kleshch, Pavel Serbun, Anton Orekhov, Dirk Lützenkirchen-HechtORCiD, Alexander N. Obraztsov, Christian PrommesbergerORCiD, Christoph LangerORCiD, Rupert SchreinerORCiDGND, Dirk Lutzenkirchen-HechtORCiD |
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DOI: | https://doi.org/10.1109/IVNC.2017.8051580 |
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Parent Title (English): | 2017 30th International Vacuum Nanoelectronics Conference (IVNC), 10-14 July 2017, Regensburg, Germany |
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Publisher: | IEEE |
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Document Type: | conference proceeding (article) |
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Language: | English |
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Year of first Publication: | 2017 |
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Release Date: | 2022/05/05 |
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Tag: | Current measurement; Ions; Iron; Scanning electron microscopy; Tungsten; field emission; metal nanoparticles; nanoparticles; p-type silicon; silicon |
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First Page: | 138 |
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Last Page: | 139 |
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Institutes: | Fakultät Angewandte Natur- und Kulturwissenschaften |
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| Fakultät Angewandte Natur- und Kulturwissenschaften / Labor Mikrosensorik |
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Begutachtungsstatus: | peer-reviewed |
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research focus: | Sensorik |
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Licence (German): | Keine Lizenz - Es gilt das deutsche Urheberrecht: § 53 UrhG |
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