MetadatenAuthor: | Michael BachmannORCiD, Florian Dams, Felix Düsberg, Martin Hofmann, Andreas Pahlke, Christoph LangerORCiD, Robert Damian ŁawrowskiORCiD, Christian PrommesbergerORCiD, Rupert SchreinerORCiDGND |
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DOI: | https://doi.org/10.1109/IVNC.2017.8051550 |
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Parent Title (German): | International Vacuum Nanoelectronics Conference (IVNC), 30th, 2017, Regensburg |
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Publisher: | IEEE |
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Document Type: | conference proceeding (article) |
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Language: | English |
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Year of first Publication: | 2017 |
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Release Date: | 2021/05/27 |
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Tag: | Circuit stability; Current measurement; Electron sources; Power system stability; Stability analysis; Standards; Voltage measurement |
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First Page: | 66 |
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Last Page: | 67 |
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Institutes: | Fakultät Angewandte Natur- und Kulturwissenschaften |
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| Fakultät Angewandte Natur- und Kulturwissenschaften / Labor Mikrosensorik |
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Begutachtungsstatus: | peer-reviewed |
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research focus: | Sensorik |
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