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Extraction of the characteristics of limiting elements from field emission measurement data

  • In this contribution we will present an algorithm to extract the characteristics of non-Fowler-Nordheim (FN) circuit elements from saturation limited field emission (FE) measurement data. The method for calculating the voltage drop on limiting circuit elements is based on circuit theory as well as Newton's method. Since no assumption on the limiting circuit is made, this method is applicable to any FE data showing saturation. To be able to determine the significance of any parameter output, the uncertainties of data and extracted parameters are fully taken into account throughout the algorithm. External serial resistors and a limiting p-doped substrate are analyzed, where the latter shows a diode-like behavior.

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Metadaten
Author:Michael BachmannORCiD, Florian Dams, Felix Düsberg, Martin Hofmann, Andreas Pahlke, Christoph LangerORCiD, Robert Damian ŁawrowskiORCiD, Christian PrommesbergerORCiD, Rupert SchreinerORCiDGND
DOI:https://doi.org/10.1109/IVNC.2016.7551474
ISSN:2380-6311
Parent Title (English):29th International Vacuum Nanoelectronics Conference (IVNC), 2016, 11-15 July, Vancouver, BC, Canada
Publisher:IEEE
Document Type:conference proceeding (article)
Language:English
Year of first Publication:2016
Release Date:2021/05/31
First Page:81
Last Page:82
Institutes:Fakultät Angewandte Natur- und Kulturwissenschaften
Fakultät Angewandte Natur- und Kulturwissenschaften / Labor Mikrosensorik
Begutachtungsstatus:peer-reviewed
research focus:Sensorik