TY - JOUR A1 - Tan, Pi Lin A1 - Yeap, Guan Yeow A1 - Chow, Wen Shyang A1 - Schreiner, Rupert A1 - Cheong, Kuan Yew T1 - Effect of Thickness of Porphyrin on Electrical Properties of Organic Devices JF - Advanced Materials Research (AMR) N2 - The study on electrical properties for both 2,3,7,8,12,13,17,18-octaethyl-21,23H-porphine Cu (II) (Cu-porphyrin) and 2,3,7,8,12,13,17,18-octaethyl-21,23H-porphine (porphyrin) thin film, which were fabricated using spin coating method was conducted. Porphyrins were diluted with chloroform of various concentrations (0.05 mg/ml, 0.1 mg/ml, 0.5 mg/ml, 2.0 mg/ml and 3.0 mg/ml). The solution was spin coated on top of glass substrates. A layer of aluminum was evaporated on top of the organic thin film through thermal evaporation and shadow mask was placed on top of the organic thin film where two electrodes with a gap of 50 μm were formed. Surface morphology of the organic thin film was observed by scanning electron microscope (SEM) and profilometer. Different concentrations of organic solutions greatly affected the molecular packing and arrangement order of the organic thin film and thickness of the organic layer and eventually affected electrical properties of the devices. KW - Porphyrin KW - Electrical Properties KW - Spin Coating Y1 - 2014 U6 - https://doi.org/10.4028/www.scientific.net/AMR.1024.381 SN - 1662-8985 SN - 1022-6680 VL - 1024 SP - 381 EP - 384 PB - Trans Tech Publications Ltd. CY - Baech ER -