<?xml version="1.0" encoding="utf-8"?>
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  <doc>
    <id>1192</id>
    <completedYear/>
    <publishedYear>2013</publishedYear>
    <thesisYearAccepted/>
    <language>deu</language>
    <pageFirst>577</pageFirst>
    <pageLast>585</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2021-02-06</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="deu">Mut zu Fehlern, um die Qualität zu steigern – Fault-Injection zur Steigerung der Zuverlässigkeit</title>
    <parentTitle language="deu">Tagungsband, 6th Embedded Software Engineering, Kongress 2013, 2. bis 6. Dezember 2013, Sindelfingen</parentTitle>
    <identifier type="isbn">978-3-8343-2408-5</identifier>
    <enrichment key="opus.source">publish</enrichment>
    <author>Stefan Krämer</author>
    <author>Erol Simsek</author>
    <author>Jürgen Braun</author>
    <author>Michael Deubzer</author>
    <author>Armin Stingl</author>
    <author>Martin Hobelsberger</author>
    <author>Jürgen Mottok</author>
    <collection role="institutes" number="FakEI">Fakultät Elektro- und Informationstechnik</collection>
    <collection role="institutes" number="">Laboratory for Safe and Secure Systems (LAS3)</collection>
    <collection role="othforschungsschwerpunkt" number="">Digitale Transformation</collection>
  </doc>
</export-example>
