<?xml version="1.0" encoding="utf-8"?>
<export-example>
  <doc>
    <id>1135</id>
    <completedYear/>
    <publishedYear>2017</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume>102480H</volume>
    <type>conferenceobject</type>
    <publisherName>Society of Photo-Optical Instrumentation Engineers (SPIE)</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2021-02-05</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Field emission properties of ring-shaped Si ridges with DLC coating</title>
    <abstract language="eng">We report on the fabrication and the emission characterization of single ring-shaped Si ridges with a coating of diamond-like carbon (DLC). The reactive ion etching and the subsequent inductively coupled plasma step were adjusted to realize ring-shaped Si ridges with a height of 7.5 μm respectively 15 μm and an apex radius of 20 – 25 nm. The samples were coated with a DLC layer (thickness ≈ 2 – 5 nm) by a filtered cathodic vacuum arc deposition system in order to lower the work function of the emitter and to improve the field emission characteristics. The field emission characterizations were done in diode configuration with cathode and anode separated by a 50 μm thick mica spacer. A higher emission current was carried out for the ring-shaped Si ridge in comparison to the point-shaped Si tips due to the increased emission area. The highest emission current of 0.22 μA at 1000 V was measured on a DLC-coated sample with the highest aspect ratio. No degradation of the emission current was observed in the plateau regime during a measurement period of 6 h. Finally, no decreasing performance of the field emission properties was found due to changes in the geometry or destructions.</abstract>
    <parentTitle language="eng">Proc. SPIE 10248, Nanotechnology VIII, 102480H (30 May 2017)</parentTitle>
    <identifier type="doi">10.1117/12.2265627</identifier>
    <enrichment key="ConferenceStatement">SPIE Microtechnology, International Society for Optics and Photonics, 2017, Barcelona, Spain</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <author>Christian Prommesberger</author>
    <author>Robert Damian Ławrowski</author>
    <author>Christoph Langer</author>
    <author>Mirgen Mecani</author>
    <author>Yifeng Huang</author>
    <author>Juncong She</author>
    <author>Rupert Schreiner</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Etching</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Scanning electron microscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Silicon carbide</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Carbon</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Mica</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Oxides</value>
    </subject>
    <collection role="ddc" number="621">Angewandte Physik</collection>
    <collection role="institutes" number="FakANK">Fakultät Angewandte Natur- und Kulturwissenschaften</collection>
    <collection role="persons" number="schreinerlmconf">Schreiner, Rupert (Prof. Dr.), Konferenzbeiträge - Labor für Mikrosensorik</collection>
    <collection role="othforschungsschwerpunkt" number="16317">Sensorik</collection>
    <collection role="institutes" number="">Labor Mikrosensorik</collection>
  </doc>
  <doc>
    <id>1137</id>
    <completedYear/>
    <publishedYear>2016</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>145</pageFirst>
    <pageLast>146</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject</type>
    <publisherName>IEEE</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2021-02-05</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Gated p-Si field emission cathode applied in an ionization vacuum gauge</title>
    <abstract language="eng">A commercial Bayard-Alpert ionization vacuum gauge was equipped with a field emission electron source based on a cathode consisting of an array of 16 gated, p-doped, and DLC-coated Si-tips and characterized. An anode current of about 1.3 μA led to an ion current of 7 fA at 3×10 -7 mbar and 0.8 pA at 4×10 -5 mbar. Whereas at pressures higher than 4×10 -5 mbar the emission current of the electron source decreased, the ratio of ion and anode current remained linear. A nearly constant sensitivity of ~ 17 mbar -1 of the ionization vacuum gauge within the investigated pressure range was depicted.</abstract>
    <parentTitle language="eng">29th International Vacuum Nanoelectronics Conference (IVNC), 2016,  11-15 July, Vancouver, BC, Canada</parentTitle>
    <identifier type="issn">2380-6311</identifier>
    <identifier type="doi">10.1109/IVNC.2016.7551500</identifier>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="BegutachtungStatus">peer-reviewed</enrichment>
    <author>Christoph Langer</author>
    <author>Christian Prommesberger</author>
    <author>Robert Damian Ławrowski</author>
    <author>Rupert Schreiner</author>
    <author>Yifeng Huang</author>
    <author>Juncong She</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>field emission</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>field emitter array</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Si</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>DLC</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>electron source</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>ionization vacuum gauge</value>
    </subject>
    <collection role="ddc" number="621">Angewandte Physik</collection>
    <collection role="institutes" number="FakANK">Fakultät Angewandte Natur- und Kulturwissenschaften</collection>
    <collection role="persons" number="schreinerlmconf">Schreiner, Rupert (Prof. Dr.), Konferenzbeiträge - Labor für Mikrosensorik</collection>
    <collection role="othforschungsschwerpunkt" number="16317">Sensorik</collection>
    <collection role="institutes" number="">Labor Mikrosensorik</collection>
  </doc>
  <doc>
    <id>1383</id>
    <completedYear/>
    <publishedYear>2017</publishedYear>
    <thesisYearAccepted/>
    <language>deu</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>periodicalpart</type>
    <publisherName/>
    <publisherPlace>Regensburg</publisherPlace>
    <creatingCorporation>Ostbayerische Technische Hochschule Regensburg</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="deu">Forschungsbericht 2017</title>
    <identifier type="isbn">978-3-9818209-3-5</identifier>
    <identifier type="urn">urn:nbn:de:bvb:898-opus4-13835</identifier>
    <identifier type="doi">10.35096/othr/pub-1383</identifier>
    <author>Karsten Weber</author>
    <author>Sebastian Dendorfer</author>
    <author>Franz Süß</author>
    <author>Simone Kubowitsch</author>
    <author>Thomas Schratzenstaller</author>
    <author>Sonja Haug</author>
    <author>Christa Mohr</author>
    <author>Hans Kiesl</author>
    <author>Jörg Drechsler</author>
    <author>Markus Westner</author>
    <author>Jörn Kobus</author>
    <author>Martin J. W. Schubert</author>
    <author>Stefan Zenger</author>
    <author>Alexander Pietsch</author>
    <author>Josef Weiß</author>
    <author>Sebastian Hinterseer</author>
    <author>Roland Schieck</author>
    <author>Stefanie Scherzinger</author>
    <author>Meike Klettke</author>
    <author>Andreas Ringlstetter</author>
    <author>Uta Störl</author>
    <author>Tegawendé F. Bissyandé</author>
    <author>Achim Seeburger</author>
    <author>Timo Schindler</author>
    <author>Ralf Ramsauer</author>
    <author>Jan Kiszka</author>
    <author>Andreas Kölbl</author>
    <author>Daniel Lohmann</author>
    <author>Wolfgang Mauerer</author>
    <author>Johannes Maier</author>
    <author>Ulrike Scorna</author>
    <author>Christoph Palm</author>
    <author>Alexander Soska</author>
    <author>Jürgen Mottok</author>
    <author>Andreas Ellermeier</author>
    <author>Daniel Vögele</author>
    <author>Stefan Hierl</author>
    <author>Ulrich Briem</author>
    <author>Knut Buschmann</author>
    <author>Ingo Ehrlich</author>
    <author>Christian Pongratz</author>
    <author>Benjamin Pielmeier</author>
    <author>Quirin Tyroller</author>
    <author>Gareth J. Monkman</author>
    <author>Franz Gut</author>
    <author>Carina Roth</author>
    <author>Peter Hausler</author>
    <author>Rudolf Bierl</author>
    <author>Christian Prommesberger</author>
    <author>Robert Damian Ławrowski</author>
    <author>Christoph Langer</author>
    <author>Rupert Schreiner</author>
    <author>Yifeng Huang</author>
    <author>Juncong She</author>
    <author>Andreas Ottl</author>
    <author>Walter Rieger</author>
    <author>Agnes Kraml</author>
    <author>Thomas Poxleitner</author>
    <author>Simon Hofer</author>
    <author>Benjamin Heisterkamp</author>
    <author>Maximilian Lerch</author>
    <author>Nike Sammer</author>
    <author>Olivia Golde</author>
    <author>Felix Wellnitz</author>
    <author>Sandra Schmid</author>
    <author>Claudia Muntschick</author>
    <author>Wolfgang Kusterle</author>
    <author>Ivan Paric</author>
    <author>Oliver Brückl</author>
    <author>Matthias Haslbeck</author>
    <author>Ottfried Schmidt</author>
    <author>Peter Schwanzer</author>
    <author>Hans-Peter Rabl</author>
    <author>Michael Sterner</author>
    <author>Franz Bauer</author>
    <author>Sven Steinmann</author>
    <author>Fabian Eckert</author>
    <author>Andreas Hofrichter</author>
    <series>
      <title>Forschungsberichte der OTH Regensburg</title>
      <number>2017</number>
    </series>
    <subject>
      <language>deu</language>
      <type>swd</type>
      <value>Forschung</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>swd</type>
      <value>Forschungsbericht</value>
    </subject>
    <collection role="institutes" number="HL">Hochschulleitung/Hochschulverwaltung</collection>
    <collection role="othpublikationsherkunft" number="">Von der OTH Regensburg herausgegeben</collection>
    <collection role="persons" number="weberlate">Weber, Karsten (Prof. Dr.) - Labor für Technikfolgenabschätzung und Angewandte Ethik</collection>
    <collection role="institutes" number="IAFW">Zentrum für Forschung und Transfer (ZFT ab 2024; vorher: IAFW)</collection>
    <collection role="persons" number="sternerfenes">Sterner, Michael (Prof. Dr.) - FENES / Forschungsgruppe Energiespeicher</collection>
    <collection role="persons" number="bruecklfenes">Brückl, Oliver (Prof. Dr.) - FENES / Forschungsgruppe Energienetze</collection>
    <collection role="persons" number="hauglasofo">Haug, Sonja (Prof. Dr.) - Labor Empirische Sozialforschung</collection>
    <thesisPublisher>Ostbayerische Technische Hochschule Regensburg</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-oth-regensburg/files/1383/Forschungsbericht_OTHR_2017.pdf</file>
  </doc>
  <doc>
    <id>8559</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber>2</pageNumber>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject</type>
    <publisherName>IEEE</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2025-11-03</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Investigation on the influence of internal voltage drops on the emission behavior of silicon field emission arrays using CMOS image sensor</title>
    <abstract language="eng">In this paper we report on an improved measurement and analysis method for determining the emission current distribution of field emitter arrays with CMOS sensors. It can also be used for field emission arrays where not all surfaces of the emitters are at the same electrical potential (e.g. for p-doped Si tips, where a strong current saturation occurs). To demonstrate the functionality of this method, a n-doped field emission array was measured using a variable external series resistance. Brightness variations in emission spots were analyzed to re-calculate the known series resistances for comparison. The re-calculated value is in good agreement with the actual value of the resistance. This method offers a quantitative approach to assess internal voltage drop effects on field emission using optical readout</abstract>
    <parentTitle language="eng">38th International Vacuum Nanoelectronics Conference (IVNC)</parentTitle>
    <identifier type="doi">10.1109/IVNC65669.2025.11120937</identifier>
    <enrichment key="ConferenceStatement">08-11 July 2025, Reykjavik, Iceland</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="BegutachtungStatus">peer-reviewed</enrichment>
    <licence>Keine Lizenz - Es gilt das deutsche Urheberrecht: § 53 UrhG</licence>
    <author>Ali Asgharzade</author>
    <author>Mathias Bartl</author>
    <author>Matthias Hausladen</author>
    <author>Yang Chen</author>
    <author>Philipp Buchner</author>
    <author>Simon Edler</author>
    <author>Michael Bachmann</author>
    <author>Juncong She</author>
    <author>Rupert Schreiner</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>field emission imaging</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>field emission</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>CMOS sensor</value>
    </subject>
    <collection role="institutes" number="FakANK">Fakultät Angewandte Natur- und Kulturwissenschaften</collection>
    <collection role="persons" number="schreinerlmconf">Schreiner, Rupert (Prof. Dr.), Konferenzbeiträge - Labor für Mikrosensorik</collection>
    <collection role="institutes" number="">Labor Mikrosensorik</collection>
    <collection role="DFGFachsystematik" number="1">Ingenieurwissenschaften</collection>
    <collection role="othforschungsschwerpunkt" number="">Materialien und Produktion</collection>
  </doc>
</export-example>
