@inproceedings{DegueldreWaasKucera, author = {Degueldre, Dennis and Waas, Thomas and Kucera, Markus}, title = {Electromagnetic Emission of an Optical-to-BroadR-Reach Converter}, series = {Proceedings of the 4th International Conference on Pervasive and Embedded Computing and Communication Systems (PECCS), 2014, Lisbon, Portugal}, booktitle = {Proceedings of the 4th International Conference on Pervasive and Embedded Computing and Communication Systems (PECCS), 2014, Lisbon, Portugal}, isbn = {978-989-758-000-0}, issn = {2184-2817}, doi = {10.5220/0004711401310135}, pages = {131 -- 135}, abstract = {The automotive solution for Ethernet is BroadR-Reach, which cannot be found as a common Ethernet-interface in the consumer industry. Hence a media converter from IEEE 802.3 Ethernet to BroadR-Reach is needed to debug and test the communication of automotive devices under test (DUT). If the functionality of a BroadR-Reach connection has to be tested for electromagnetic compatibility (EMC), a BroadR-Reach to optical media converter is needed, which has to comply to the same EMC test specifications as the DUT. This research explains the internal structure of a media converter and defines a test setup for copper bound emission test of BroadR-Reach. By using a standardized stripline measurement like it is common for electromagnetic emission test, it could be shown, that the tested Technica/Tinytron media converter can safely be used inside an EMC chamber.}, language = {en} }