@inproceedings{SokolowskiTintenBlomeDietrichetal., author = {Sokolowski-Tinten, Klaus and Blome, Christian and Dietrich, Clemens and Blums, Juris and Horn-von Hoegen, Michael and von der Linde, D. and Cavalleri, Andrea and Squier, Jeff A. and Kammler, Martin}, title = {Structural dynamics in laser-excited solids investigated with femtosecond x-ray diffraction}, series = {2002 Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference, 19-24 May 2002, Long Beach, CA, USA}, booktitle = {2002 Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference, 19-24 May 2002, Long Beach, CA, USA}, publisher = {IEEE}, doi = {10.1109/QELS.2002.1031182}, pages = {115 -- 116}, abstract = {Summary form only given. Ultrashort x-ray pulses offer a unique combination of atomic-scale spatial and temporal resolution, which permits direct measurements of structural transients on an ultrafast time scale. Using time-resolved X-ray diffraction with femtosecond, multi-keV X-ray pulses we have studied transient lattice dynamics in optically excited semiconductors.}, language = {en} } @article{SokolowskiTintenBlomeDietrichetal., author = {Sokolowski-Tinten, Klaus and Blome, Christian and Dietrich, Clemens and Tarasevitch, A. and Horn-von Hoegen, Michael and von der Linde, D. and Cavalleri, Andrea and Squier, Jeff A. and Kammler, Martin}, title = {Femtosecond time-resolved X-ray diffraction study of ultrafast structural dynamics in laser-excited solids}, series = {International Conference on Ultrafast Phenomena, 12 May 2002, Vancouver Canada}, volume = {71}, journal = {International Conference on Ultrafast Phenomena, 12 May 2002, Vancouver Canada}, publisher = {Optica Publishing Grou}, doi = {10.1007/978-3-642-59319-2_10}, pages = {36 -- 38}, abstract = {Time-resolved x-ray diffraction with sub-300 fs, multi-keV x-ray pulses was used to study ultrafast lattice dynamics in laser-irradiated germanium and bismuth. In bismuth strong excitation of optical phonons is observed prior to disordering of the material.}, language = {en} }