Element-Specific Hysteresis Loop Measurements on Individual 35 nm Islands with Scanning Transmission X-Ray Microscopy
- Using scanning transmission X-ray microscopy combined with X-ray magnetic circular dichroism, element-specific hysteresis loops with a 25 nm X-ray probe are obtained on 35 nm Fe/Gd multilayer nanoislands fabricated by extreme ultra-violet interference lithography. Local hysteresis loops measured for the individual islands and the antidot film between the islands display similar behavior resulting from the lateral confinement. Line scan measurements confirm ferrimagnetic coupling between Fe and Gd in the patterned region. The ability to measure magnetization reversal with X-rays at high spatial resolution will provide an important tool for future characterization of sub-50 nm nanostructures.
Author: | Feng Luo, Thomas EimüllerGND, Edward Amaladass, Min-Sang Lee, Laura J. Heyderman, Harun H. Solak, Tolek Tyliszczak |
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DOI: | https://doi.org/10.1166/jnn.2012.5778 |
Identifier: | 1533-4899 OPAC HS OPAC extern |
Parent Title (English): | Journal of Nanoscience and Nanotechnology |
Publisher: | American Scientific Publishers (ASP) |
Place of publication: | Stevenson Ranch, California |
Document Type: | Article |
Language: | English |
Date of Publication (online): | 2012/03/01 |
Year of first Publication: | 2012 |
Volume: | Volume 12 |
Issue: | Issue 3 |
Number of pages: | 5 Seiten |
First Page: | 2484 |
Last Page: | 2488 |
Institutes: | Fakultät Maschinenbau |
Dewey Decimal Classification: | 6 Technik, Medizin, angewandte Wissenschaften / 62 Ingenieurwissenschaften |
Publication Lists: | Eimüller, Thomas |
Publication reviewed: | begutachtet |
Release Date: | 2019/11/26 |