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In-the-loop tests can save time, money and effort by helping to identify errors before they occur in the target environment or at the customer. These tests can be designed in various forms, depending on the current state of development. From an organizational point of view, it is desirable to formulate tests only once and to use them in different environments without further adjustments. This thesis focuses on deviations between in-the-loop test levels and the possible reuse of tests. In addition to the explanation and classification in the field of software testing, previous work in this area is also considered. Computers with x86-64 processors are typically used for the development of embedded system software, which do not correspond to the processors of the target platform. Furthermore, the exchange of data does not necessarily take the form as intended for the target applications, but possibly only in a modelling environment or through simplified channels. With regard to the desired tests to be carried out, this can lead to a number of problems, which are identified in the context of this work. In addition to accuracy and performance aspects, requirements and designs for reusability are presented.