TY - CHAP A1 - Leitner, Lukas A1 - Endisch, Christian T1 - Skewed and Heavy-Tailed Hidden Random Walk Models with Applications in Automated Production Testing T2 - 2018 IEEE 22nd International Conference on Intelligent Engineering Systems (INES) UR - https://doi.org/10.1109/INES.2018.8523927 Y1 - 2018 UR - https://doi.org/10.1109/INES.2018.8523927 SN - 978-1-5386-1122-7 SP - 000281 EP - 000286 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Ziegmann, Johannes A1 - Schmid, Michael A1 - Endisch, Christian T1 - Sensitivity Analysis for Driver Energy Prediction with Environmental Features and Naturalistic Data T2 - 2018 IEEE International Conference on Intelligent Engineering Systems (INES) UR - https://doi.org/10.1109/INES.2018.8523987 KW - Driver Energy Prediction KW - Environmental Feature Selection KW - Sensitivity Analysis KW - Feature Transformation KW - Filter and Wrapper Methods Y1 - 2018 UR - https://doi.org/10.1109/INES.2018.8523987 SN - 978-1-5386-1122-7 SP - 000199 EP - 000206 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Herrmann, Patrick A1 - Gerngroß, Martin A1 - Endisch, Christian T1 - Numerical Optimization in Planning of Flexible Needle Winding Trajectories T2 - 2018 IEEE International Conference on Intelligent Engineering Systems (INES) UR - https://doi.org/10.1109/INES.2018.8523924 KW - Windings KW - Wires KW - Trajectory KW - Optimization KW - Splines (mathematics) KW - Needles KW - Stators Y1 - 2018 UR - https://doi.org/10.1109/INES.2018.8523924 SN - 978-1-5386-1122-7 SP - 000255 EP - 000260 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Altmannshofer, Simon A1 - Endisch, Christian A1 - Trieu, Khanh Duy T1 - On-line identification and identifiability analysis of electrical and mechanical parameters of induction machines T2 - 2017 IEEE International Conference on Advanced Intelligent Mechatronics (AIM) UR - https://doi.org/10.1109/AIM.2017.8014079 KW - Rotors KW - Estimation KW - Induction machines KW - Stators KW - Eigenvalues and eigenfunctions KW - Mathematical model KW - Inductance Y1 - 2017 UR - https://doi.org/10.1109/AIM.2017.8014079 SN - 978-1-5090-6000-9 SN - 2159-6255 SP - 577 EP - 583 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Müller, Tino A1 - Endisch, Christian T1 - An estimation based iterative learning control approach for cross-coupled vehicle test systems T2 - 2017 IEEE International Conference on Advanced Intelligent Mechatronics (AIM) UR - https://doi.org/10.1109/AIM.2017.8014210 KW - Convergence KW - Testing KW - Control systems KW - Estimation KW - Iterative learning control KW - Load modeling KW - Adaptation models Y1 - 2017 UR - https://doi.org/10.1109/AIM.2017.8014210 SN - 978-1-5090-6000-9 SN - 978-1-5090-5998-0 SN - 2159-6255 SP - 1375 EP - 1381 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Ziegmann, Johannes A1 - Shi, Jieqing A1 - Schnörer, Tobias A1 - Endisch, Christian T1 - Analysis of individual driver velocity prediction using data-driven driver models with environmental features T2 - 2017 IEEE Intelligent Vehicles Symposium UR - https://doi.org/10.1109/IVS.2017.7995770 KW - vehicles KW - predictive models KW - training KW - prediction algorithms KW - kernel KW - navigation KW - biological system modeling Y1 - 2017 UR - https://doi.org/10.1109/IVS.2017.7995770 SN - 978-1-5090-4804-5 SP - 517 EP - 522 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Vögele, Ulrich A1 - Ziegmann, Johannes A1 - Endisch, Christian T1 - Driver adaptive predictive velocity control T2 - 2017 IEEE 20th International Conference on Intelligent Transportation Systems (ITSC) UR - https://doi.org/10.1109/ITSC.2017.8317668 KW - Predictive Velocity Control KW - Longitudinal Vehicle Control KW - Driver Adpative KW - Multi-Criteria Optimization Y1 - 2017 UR - https://doi.org/10.1109/ITSC.2017.8317668 SN - 978-1-5386-1526-3 SN - 2153-0017 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Herrmann, Patrick A1 - Gerngroß, Martin A1 - Endisch, Christian A1 - Stenzel, Peer A1 - Uhlmann, Philipp T1 - Automated contacting technology for needle winding applications with distributed windings T2 - 2017 7th International Electric Drives Production Conference (EDPC) Proceedings UR - https://doi.org/10.1109/EDPC.2017.8328169 KW - Contacting Technology KW - Joining Technology KW - Automation KW - Resistance Welding KW - Distributed Winding KW - Needle Winding Y1 - 2017 UR - https://doi.org/10.1109/EDPC.2017.8328169 SN - 978-1-5386-1069-5 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Gerngroß, Martin A1 - Herrmann, Patrick A1 - Westermaier, Christian A1 - Endisch, Christian T1 - Highly flexible needle winding kinematics for traction stators based on a standard industrial robot T2 - 2017 7th International Electric Drives Production Conference (EDPC) UR - https://doi.org/10.1109/EDPC.2017.8328147 KW - Needle Winding KW - Industrial Robot KW - Distributed Windings KW - Automation KW - Stator Production Y1 - 2017 UR - https://doi.org/10.1109/EDPC.2017.8328147 SN - 978-1-5386-1069-5 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Herrmann, Patrick A1 - Gerngroß, Martin A1 - Endisch, Christian T1 - NURBS based trajectory generation for an industrial five axis needle winding robot T2 - Conference Proceedings of 2018 4th International Conference on Control, Automation and Robotics (ICCAR) UR - https://doi.org/10.1109/ICCAR.2018.8384640 KW - needle winding KW - trajectory planning KW - constant feed rate KW - NURBS KW - smooth path planning Y1 - 2018 UR - https://doi.org/10.1109/ICCAR.2018.8384640 SN - 978-1-5386-6338-7 SP - 31 EP - 36 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Leitner, Lukas A1 - Endisch, Christian T1 - Robust stochastic process models and parameter estimation for industrial end-of-line-testing T2 - Proceedings: 2018 IEEE International Conference on Industrial Technology (ICIT) UR - https://doi.org/10.1109/ICIT.2018.8352406 KW - Testing KW - Robustness KW - Production KW - Stochastic processes KW - Feature extraction KW - Training KW - Current measurement Y1 - 2018 UR - https://doi.org/10.1109/ICIT.2018.8352406 SN - 978-1-5090-5949-2 SP - 1520 EP - 1525 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Liebhart, Bernhard A1 - Diehl, Simon A1 - Schneider, Dominik A1 - Endisch, Christian A1 - Kennel, Ralph T1 - Enhancing the Cell Impedance Estimation of a Lithium-Ion Battery System with Embedded Power Path Switches T2 - APEC 2021: Thirty-Sixth Annual IEEE Applied Power Electronics Conference and Exposition UR - https://doi.org/10.1109/APEC42165.2021.9487173 KW - Reconfigurable Battery System KW - Impedance Spectroscopy KW - Power MOSFET KW - Pseudorandom Binary Sequence Y1 - 2021 UR - https://doi.org/10.1109/APEC42165.2021.9487173 SN - 978-1-7281-8949-9 SN - 2470-6647 SP - 967 EP - 974 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Kleiner, Jan A1 - Heider, Alexander A1 - Komsiyska, Lidiya A1 - Elger, Gordon A1 - Endisch, Christian T1 - Experimental Study on the Thermal Interactions in Novel Intelligent Lithium-Ion Modules for Electric Vehicles T2 - Proceedings of the Twentieth InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems: ITherm 2021 UR - https://doi.org/10.1109/ITherm51669.2021.9503299 KW - Intelligent battery KW - Lithium-ion KW - Reconfiguration KW - Cooling KW - Thermal management KW - Parallel connection Y1 - 2021 UR - https://doi.org/10.1109/ITherm51669.2021.9503299 SN - 978-1-7281-8539-2 SN - 2694-2135 SP - 556 EP - 562 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Liebhart, Bernhard A1 - Diehl, Simon A1 - Schmid, Michael A1 - Endisch, Christian A1 - Kennel, Ralph T1 - Improved Impedance Measurements for Electric Vehicles with Reconfigurable Battery Systems T2 - Proceedings of the Energy Conversion Congress and Exposition – Asia, 2021 (ECCE Asia 2021) UR - https://doi.org/10.1109/ECCE-Asia49820.2021.9479060 KW - Reconfigurable Battery System KW - Impedance Spectroscopy KW - Power MOSFET KW - Artificial Neural Network Y1 - 2021 UR - https://doi.org/10.1109/ECCE-Asia49820.2021.9479060 SN - 978-1-7281-6344-4 SN - 2150-6086 SP - 1736 EP - 1742 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Herrmann, Patrick A1 - Gerngroß, Martin A1 - Endisch, Christian T1 - Benefits of numerical optimization and CAD/CAM in needle winding processes T2 - Proceedings, 2019 IEEE International Conference on Mechatronics (ICM) UR - https://doi.org/10.1109/ICMECH.2019.8722940 KW - needle winding technology KW - trajectory planning KW - automated trajectory generation KW - CAD/CAM KW - numerical optimization Y1 - 2019 UR - https://doi.org/10.1109/ICMECH.2019.8722940 SN - 978-1-5386-6959-4 SP - 301 EP - 307 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Gerngroß, Martin A1 - Herrmann, Patrick A1 - Endisch, Christian A1 - Westermaier, Christian T1 - Optimization of the End Winding Patterns in Needle Wound Traction Stators T2 - Proceedings, 2019 IEEE International Conference on Mechatronics (ICM) UR - https://doi.org/10.1109/ICMECH.2019.8722897 KW - needle winding KW - end winding patterns KW - optimization method KW - virtual tool chain Y1 - 2019 UR - https://doi.org/10.1109/ICMECH.2019.8722897 SN - 978-1-5386-6959-4 SP - 314 EP - 320 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Okon, Michael A1 - Endisch, Christian T1 - On air-gap approximations for slotted electrical machine models assuming radial magnetic fields T2 - Proceedings, 2019 IEEE International Conference on Industrial Technology (ICIT) UR - https://doi.org/10.1109/ICIT.2019.8755196 KW - electrical machine modeling KW - radial air-gap magnetic field KW - magnetically effective air-gap KW - slotting effects Y1 - 2019 UR - https://doi.org/10.1109/ICIT.2019.8755196 SN - 978-1-5386-6376-9 SP - 292 EP - 297 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Gerngroß, Martin A1 - Herrmann, Patrick A1 - Endisch, Christian T1 - Nonlinear modelling of dynamic wire tension for needle winding processes of distributed windings T2 - Proceedings, 2019 IEEE International Conference on Industrial Technology (ICIT) UR - https://doi.org/10.1109/ICIT.2019.8755052 Y1 - 2019 UR - https://doi.org/10.1109/ICIT.2019.8755052 SN - 978-1-5386-6376-9 SP - 151 EP - 156 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Bogdanovs, Arturs A1 - Krievs, Oskars A1 - Pforr, Johannes T1 - Fault-Tolerant Operation Algorithm for a Multi-Phase DC Converter with Coupled Inductors T2 - PCIM Europe 2022: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management UR - https://doi.org/10.30420/565822070 Y1 - 2022 UR - https://doi.org/10.30420/565822070 SN - 978-3-8007-5822-7 N1 - Auch veröffentlicht auf IEEE: https://ieeexplore.ieee.org/document/9862095/ SP - 506 EP - 515 PB - VDE Verlag CY - Berlin ER - TY - JOUR A1 - Zippelius, Andreas A1 - Hanss, Alexander A1 - Schmid, Maximilian A1 - Pérez-Velázquez, Judith A1 - Elger, Gordon T1 - Reliability analysis and condition monitoring of SAC+ solder joints under high thermomechanical stress conditions using neuronal networks JF - Microelectronics Reliability N2 - The thermo-mechanical fatigue of different SAC+ solders is investigated using transient thermal analysis (TTA) and predicted using artificial neural networks (ANN). TTA measures the thermal impedance and allows detection of solder cracks and delamination of material interfaces. LEDs soldered to printed circuit boards using seven different solders were aged within passive air-to-air temperature shock tests with TTA measurements every 50 cycles with the increase of the thermal resistance as failure criterium. A SnAgCuSb solder showed the best performance improvement over the SAC305 reference under the test conditions. In addition to standard evaluation by the cumulative failure-curve and Weibull plot, new approaches for reliability assessment are investigated to assess the reliability of the solder joint of the individual LEDs. A hybrid approach to predict failures in the solder joints of the individual LEDs during accelerated stress testing is set-up which processes the TTA data using artificial neural networks with memory, specifically LSTM, where the memory allows full use of the measurement history. Two ANN approaches, regression and classification, are used. Both approaches are shown to be quite accurate. The greater information gained from the regression approach requires more processing using external knowledge of the problem requirements, whereas the categorical approach can be more directly implemented. The results demonstrate the advantages of integrated approaches for assessment of the remaining useful life of solder joints. UR - https://doi.org/10.1016/j.microrel.2021.114461 KW - Artificial neural networks KW - LSTM KW - Prediction KW - Reliability KW - Solder joints KW - Transient thermal analysis Y1 - 2022 UR - https://doi.org/10.1016/j.microrel.2021.114461 UR - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:573-19719 SN - 0026-2714 VL - 2022 IS - 129 PB - Elsevier CY - Amsterdam ER - TY - CHAP A1 - Hanss, Alexander A1 - Schmid, Maximilian A1 - Bhogaraju, Sri Krishna A1 - Conti, Fosca A1 - Elger, Gordon T1 - Reliability of sintered and soldered high power chip size packages and flip chip LEDs T2 - ECTC - The 2018 IEEE 68th Electronic Components and Technology Conference: Proceedings UR - https://doi.org/10.1109/ECTC.2018.00312 Y1 - 2018 UR - https://doi.org/10.1109/ECTC.2018.00312 SN - 978-1-5386-5000-4 SP - 2080 EP - 2088 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Bhogaraju, Sri Krishna A1 - Mokhtari, Omid A1 - Pascucci, Jacopo A1 - Hanss, Alexander A1 - Schmid, Maximilian A1 - Conti, Fosca A1 - Elger, Gordon T1 - Hybrid Cu particle paste with surface-modified particles for high temperature electronics packaging T2 - Proceedings 22nd European Microelectronics and Packaging Conference, EMPC UR - https://doi.org/10.23919/EMPC44848.2019.8951887 Y1 - 2020 UR - https://doi.org/10.23919/EMPC44848.2019.8951887 SN - 978-1-7281-6291-1 PB - IEEE CY - Piscataway ER - TY - JOUR A1 - Hanss, Alexander A1 - Schmid, Maximilian A1 - Liu, E A1 - Elger, Gordon T1 - Transient thermal analysis as measurement method for IC package structural integrity JF - Chinese Physics B UR - https://doi.org/10.1088/1674-1056/24/6/068105 Y1 - 2015 UR - https://doi.org/10.1088/1674-1056/24/6/068105 SN - 2058-3834 SN - 1674-1056 VL - 24 IS - 6 PB - IOP Publishing CY - Bristol ER - TY - JOUR A1 - Hanss, Alexander A1 - Elger, Gordon T1 - Residual free solder process for fluxless solder pastes JF - Soldering & Surface Mount Technology UR - https://doi.org/10.1108/SSMT-10-2017-0030 KW - Reflow soldering KW - LED KW - Fluxless KW - Solder process Y1 - 2018 UR - https://doi.org/10.1108/SSMT-10-2017-0030 SN - 0954-0911 VL - 30 IS - 2 SP - 118 EP - 128 PB - Emerald CY - Bingley ER - TY - CHAP A1 - Hanss, Alexander A1 - Schmid, Maximilian A1 - Bhogaraju, Sri Krishna A1 - Conti, Fosca A1 - Elger, Gordon T1 - Process development and reliability of sintered high power chip size packages and flip chip LEDs T2 - 2018 International Conference on Electronics Packaging and iMAPS All Asia Conference (ICEP-IAAC) UR - https://doi.org/10.23919/ICEP.2018.8374351 KW - LED KW - Reliability KW - Sintering KW - Transient Thermal Testing Y1 - 2018 UR - https://doi.org/10.23919/ICEP.2018.8374351 SN - 978-4-9902-1885-0 SP - 479 EP - 484 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Bhogaraju, Sri Krishna A1 - Hanss, Alexander A1 - Schmid, Maximilian A1 - Elger, Gordon A1 - Conti, Fosca T1 - Evaluation of silver and copper sintering of first level interconnects for high power LEDs T2 - 2018 7th Electronic System-Integration Technology Conference (ESTC) UR - https://doi.org/10.1109/ESTC.2018.8546499 KW - transient thermal analysis KW - pressureless silver sintering KW - pressureless copper sintering KW - bonding atmosphere KW - particle size KW - binder chemistry Y1 - 2018 UR - https://doi.org/10.1109/ESTC.2018.8546499 SN - 978-1-5386-6814-6 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Schmid, Maximilian A1 - Elger, Gordon T1 - Measurement of the transient thermal impedance of MOSFETs over the sensitivity of the threshold voltage T2 - EPE'18 ECCE Europe KW - Reliability KW - MOSFET KW - Thermal stress KW - Thermal design KW - Measurement Y1 - 2018 UR - https://ieeexplore.ieee.org/document/8515480 SN - 978-9-0758-1528-3 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Elger, Gordon A1 - Hanss, Alexander A1 - Schmid, Maximilian T1 - Transient Thermal Analysis as In-Situ Method in Accelerated Stress Tests to Access Package Integrity of LEDs T2 - 2018 24rd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) UR - https://doi.org/10.1109/THERMINIC.2018.8593278 KW - Temperature measurement KW - Conferences KW - Integrated circuits KW - Light emitting diodes KW - Transient analysis KW - Temperature dependence KW - Thermal analysis Y1 - 2018 UR - https://doi.org/10.1109/THERMINIC.2018.8593278 SN - 978-1-5386-6759-0 PB - IEEE CY - Piscataway ER - TY - JOUR A1 - Conti, Fosca A1 - Hanss, Alexander A1 - Mokhtari, Omid A1 - Bhogaraju, Sri Krishna A1 - Elger, Gordon T1 - Formation of tin-based crystals from a SnAgCu alloy under formic acid vapor JF - New Journal of Chemistry UR - https://doi.org/10.1039/C8NJ04173C Y1 - 2018 UR - https://doi.org/10.1039/C8NJ04173C SN - 1369-9261 VL - 42 IS - 23 SP - 19232 EP - 19236 PB - RSC CY - London ER - TY - CHAP A1 - Hanss, Alexander A1 - Schmid, Maximilian A1 - Elger, Gordon T1 - Combined Accelerated Stress Test with In-Situ Thermal Impedance Monitoring to Access LED Reliability T2 - Proceedings 2018 20th International Conference on Electronic Materials and Packaging (EMAP) UR - https://doi.org/10.1109/EMAP.2018.8660833 KW - Temperature measurement KW - Light emitting diodes KW - Temperature KW - Electronic packaging thermal management KW - Temperature sensors KW - Transient analysis KW - Sensitivity Y1 - 2019 UR - https://doi.org/10.1109/EMAP.2018.8660833 SN - 978-1-5386-5642-6 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Elger, Gordon A1 - Biberger, M. A1 - Meier, M. A1 - Schweigart, Helmut A1 - Schneider, Klaus A1 - Erdogan, Hüseyin T1 - Technische Sauberkeit von Radarbaugruppen T2 - Elektronische Baugruppen und Leiterplatten EBL 2018: Multifunktionale Aufbau- und Verbindungstechnik – Beherrschung der Vielfalt Y1 - 2018 UR - https://www.dvs-media.eu/de/buecher/dvs-berichte/3644/elektronische-baugruppen-und-leiterplatten-ebl-2018 SN - 978-3-96144-026-9 SP - 339 EP - 349 PB - DVS Media GmbH CY - Düsseldorf ER - TY - CHAP A1 - Kohler, Markus A1 - Gerngroß, Martin A1 - Endisch, Christian T1 - A Test Bench Concept and Method for Image-Based Modeling of Geometric Wire Bending Behavior in Needle Winding Processes T2 - 2022 IEEE 31st International Symposium on Industrial Electronics (ISIE) UR - https://doi.org/10.1109/ISIE51582.2022.9831494 KW - wire forming KW - manufacturing KW - computer vision KW - machine vision KW - image processing KW - curve fitting KW - splines Y1 - 2022 UR - https://doi.org/10.1109/ISIE51582.2022.9831494 SN - 978-1-6654-8240-0 SN - 2163-5145 SP - 1113 EP - 1120 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Nachtsheim, Martin A1 - Korkmaz, Luetfue A1 - Schmoelz, Martin A1 - Endisch, Christian T1 - Observability Analysis for Parameter Identification of Induction Machines in Automotive Environment T2 - 2022 IEEE 31st International Symposium on Industrial Electronics (ISIE) UR - https://doi.org/10.1109/ISIE51582.2022.9831658 KW - observability KW - induction machine KW - parameter identification KW - extended Kalman Filter Y1 - 2022 UR - https://doi.org/10.1109/ISIE51582.2022.9831658 SN - 978-1-6654-8240-0 SN - 2163-5145 SP - 206 EP - 213 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Bhogaraju, Sri Krishna A1 - Schmid, Maximilian A1 - Liu, E A1 - Saccon, Rodolfo A1 - Elger, Gordon A1 - Klassen, Holger A1 - Müller, Klaus A1 - Pirzer, Georg T1 - Low cost copper based sintered interconnect material for optoelectronics packaging T2 - 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC) UR - https://doi.org/10.1109/ECTC51906.2022.00270 KW - Cu sintering KW - flakes KW - PEG600 KW - reliability KW - encapsulation KW - oxidation KW - transient thermal analysis KW - Scanning acoustic microscopy KW - μ-Raman spectroscopy Y1 - 2022 UR - https://doi.org/10.1109/ECTC51906.2022.00270 SN - 978-1-6654-7943-1 SP - 1720 EP - 1725 PB - IEEE CY - Piscataway ER - TY - JOUR A1 - Stöttner, Julia A1 - Rauscher, Andreas A1 - Endisch, Christian T1 - Pareto optimization of multilevel inverter structures regarding the DC magnitude, switching frequency and switching angles JF - International Journal of Electrical Power & Energy Systems UR - https://doi.org/10.1016/j.ijepes.2022.108259 KW - Cascaded H-bridge (CHB) KW - Electric vehicle (EV) KW - Multilevel inverter (MLI) KW - Pareto optimization (PO) Y1 - 2022 UR - https://doi.org/10.1016/j.ijepes.2022.108259 SN - 0142-0615 VL - 2022 IS - 142, Part A PB - Elsevier CY - Amsterdam ER - TY - JOUR A1 - Terbrack, Christoph A1 - Stöttner, Julia A1 - Endisch, Christian T1 - Design and Validation of the Parallel Enhanced Commutation Integrated Nested Multilevel Inverter Topology JF - IEEE Transactions on Power Electronics UR - https://doi.org/10.1109/TPEL.2022.3183859 KW - drivetrain KW - enhanced commutation integrated nested (ECIN) KW - electric vehicles KW - modular multilevel converter (MMLC) KW - parallel enhanced commutation integrated nested (PECIN) KW - power electronics Y1 - 2022 UR - https://doi.org/10.1109/TPEL.2022.3183859 SN - 1941-0107 VL - 37 IS - 12 SP - 15163 EP - 15174 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Signorini, Raffaella A1 - Pedron, Danilo A1 - Conti, Fosca A1 - Hanss, Alexander A1 - Bhogaraju, Sri Krishna A1 - Elger, Gordon T1 - Thermomechanical Stress in GaN LED Soldered on Copper Substrate Evaluated by Raman Measurements and Computer Modelling T2 - 2018 24rd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) UR - https://doi.org/10.1109/THERMINIC.2018.8593304 KW - Stress KW - Light emitting diodes KW - Gallium nitride KW - Phonons KW - Substrates KW - Temperature measurement KW - Silicon Y1 - 2018 UR - https://doi.org/10.1109/THERMINIC.2018.8593304 SN - 978-1-5386-6759-0 PB - IEEE CY - Piscataway ER - TY - JOUR A1 - Liu, E A1 - Bhogaraju, Sri Krishna A1 - Wunderle, Bernhard A1 - Elger, Gordon T1 - Investigation of stress relaxation in SAC305 with micro-Raman spectroscopy JF - Microelectronics Reliability UR - https://doi.org/10.1016/j.microrel.2022.114664 Y1 - 2022 UR - https://doi.org/10.1016/j.microrel.2022.114664 SN - 0026-2714 VL - 2022 IS - 138 PB - Elsevier CY - Amsterdam ER - TY - JOUR A1 - Rauscher, Andreas A1 - Hufnagel, Manuel A1 - Endisch, Christian T1 - Pareto optimization of wavelet filter design for partial discharge detection in electrical machines JF - Measurement N2 - A reliable detection of partial discharges (PDs) in the insulation system of electrical machines is essential to prevent premature breakdowns. Wavelet filters (WFs) are often recommended for denoising this PD measurement data. However, filtering performance strongly depends on numerous settings, which impedes an optimum filter choice. We propose an approach to systematically select the best filter for denoising PD signals. First, representative PD pulses are determined from measurement data by an averaging and a singular value decomposition method. Next, realistic benchmark signals are generated for filter assessment. Further, all possible WF combinations from a set of different mother wavelet selection methods, decomposition trees, and thresholding approaches are evaluated. On the basis of two contradicting objectives, namely mean square error of noise intervals and pulse amplitude distortion, Pareto optimization is applied to choose optimal WF settings. The corresponding filters dominate several common WF proposals from previous literature. UR - https://doi.org/10.1016/j.measurement.2022.112163 KW - Pareto optimization KW - Wavelet filter KW - Denoising KW - Ultra high frequency KW - Partial discharge KW - Electrical machine Y1 - 2022 UR - https://doi.org/10.1016/j.measurement.2022.112163 UR - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:573-30673 SN - 1873-412X SN - 0263-2241 VL - 2022 IS - 205 PB - Elsevier CY - Amsterdam ER - TY - JOUR A1 - Kleiner, Jan A1 - Lambauer, Florian A1 - Singh, Randeep A1 - Komsiyska, Lidiya A1 - Hinterberger, Michael A1 - Endisch, Christian T1 - Experimental study of cell integrated heat pipe cooling with a lithium-ion cell emulator JF - Journal of Energy Storage UR - https://doi.org/10.1016/j.est.2022.105808 Y1 - 2022 UR - https://doi.org/10.1016/j.est.2022.105808 SN - 2352-1538 SN - 2352-152X VL - 2022 IS - 56, Part A PB - Elsevier CY - Amsterdam ER - TY - CHAP A1 - Schmid, Michael A1 - Liebhart, Bernhard A1 - Kleiner, Jan A1 - Endisch, Christian A1 - Kennel, Ralph T1 - Online Detection of Soft Internal Short Circuits in Lithium-Ion Battery Packs by Data-Driven Cell Voltage Monitoring T2 - Proceedings of the Energy Conversion Congress & Exposition - Asia, 2021 (ECCE-Asia 2021) UR - https://doi.org/10.1109/ECCE-Asia49820.2021.9479175 KW - Internal Short Circuit KW - Fault Diagnosis KW - Lithium-Ion Battery KW - Battery Safety KW - Electric Vehicle Y1 - 2021 UR - https://doi.org/10.1109/ECCE-Asia49820.2021.9479175 SN - 978-1-7281-6344-4 SN - 2150-6086 SP - 1711 EP - 1718 PB - IEEE CY - Piscataway (NJ) ER - TY - JOUR A1 - Morales Torricos, Pablo A1 - Endisch, Christian A1 - Lewerenz, Meinert T1 - Apparent Aging during Accelerated Cycling Aging Test of Cylindrical Silicon Containing Li-Ion Cells JF - Batteries N2 - Accelerated cyclic aging tests are very important for research and industry to quickly characterize lithium-ion cells. However, the accentuation of stress factors and the elimination of rest periods lead to an apparent capacity fade, that can be subsequently recovered during a resting phase. This effect is attributed to the inhomogeneous lithium distribution in the anode and is observable with differential voltage analysis (DVA). We tested cylindrical 18,650 cells with Li(NixCoyAlz)O2-graphite/silicon chemistry during two cycling and resting phases. The capacity, the pulse resistance, the DVA, and the capacity difference analysis are evaluated for cells cycled at different average SOC and current rates. An apparent capacity loss of up to 12% was reported after 200 FCE for cells cycled under the presence of pressure gradients, while only 1% were at low-pressure gradients. The subsequent recovery was up to 80% of the apparent capacity loss in some cases. The impact of silicon cannot be estimated as it shows no features in the dV/dQ curves. We observe a recovery of apparent resistance increase, which is not reported for cells with pure graphite anodes. Finally, we demonstrate the strong impact of apparent aging for the lifetime prediction based on standard accelerated cyclic aging tests. UR - https://doi.org/10.3390/batteries9040230 KW - aging KW - lifetime prognosis KW - cycle life KW - NCA KW - silicon KW - mechanical stress KW - homogeneity of lithium distribution KW - capacity recovery Y1 - 2023 UR - https://doi.org/10.3390/batteries9040230 UR - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:573-35477 SN - 2313-0105 VL - 9 IS - 4 PB - MDPI CY - Basel ER - TY - JOUR A1 - Lechermann, Lorenz A1 - Kleiner, Jan A1 - Komsiyska, Lidiya A1 - Hinterberger, Michael A1 - Endisch, Christian T1 - A comparative study of data-driven electro-thermal models for reconfigurable lithium-ion batteries in real-time applications JF - Journal of Energy Storage UR - https://doi.org/10.1016/j.est.2023.107188 Y1 - 2023 UR - https://doi.org/10.1016/j.est.2023.107188 SN - 2352-1538 SN - 2352-152X VL - 2023 IS - 65 PB - Elsevier CY - Amsterdam ER - TY - JOUR A1 - Stöttner, Julia A1 - Hanzl, Christian A1 - Endisch, Christian T1 - Experimental investigation of parasitic side effects in MOSFET-based multilevel inverter for electric vehicle applications JF - Electric Power Systems Research UR - https://doi.org/10.1016/j.epsr.2023.109197 Y1 - 2023 UR - https://doi.org/10.1016/j.epsr.2023.109197 SN - 1873-2046 SN - 0378-7796 VL - 2023 IS - 218 PB - Elsevier CY - Amsterdam ER - TY - JOUR A1 - Terbrack, Christoph A1 - Speer, Sascha A1 - Endisch, Christian T1 - Control and Implementation of the Parallel Enhanced Commutation Integrated Nested Multilevel Inverter Topology JF - Electronics N2 - Due to their high efficiency and advanced battery management capability, cascaded multilevel inverters are an exciting option for battery electric powertrains. A promising, new and highly efficient cascaded multilevel inverter is the Parallel Enhanced Commutation Integrated Nested Multilevel Inverter. The inverter, with four semiconductor switches per submodule, can reconfigure individual battery cells in series and parallel and generate positive and negative phase voltages in regular four-quadrant operation. Therefore, emerging degrees of freedom in battery management and inverter operation must be managed and mapped into a specific Switching State for every switch. As controlling the high number of switches is safety-relevant, this publication profoundly explains the inverter’s functionality. We introduce a Switching Function that accepts easy-to-understand functional states as input, simplifying research on higher-level control algorithms and advanced single-cell battery-management capabilities. As the Switching Function guarantees safe operation and the correct contribution of every cell to the overall functionality of the inverter, it enables researchers to confidently use and thereby accelerate research on the promising new topology. The method we describe is fast, simple, deterministic and designed to convert setpoint specifications into an executable Switching Pattern. We prove that our Switching Function is operable on an FPGA with a twenty-kilohertz setpoint update operating a 17-level inverter. UR - https://doi.org/10.3390/electronics12143130 KW - cascaded KW - drivetrain KW - electric vehicles KW - MLI KW - PECIN KW - power electronics KW - reconfigurable battery system KW - Switching Function Y1 - 2023 UR - https://doi.org/10.3390/electronics12143130 UR - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:573-37990 SN - 2079-9292 VL - 12 IS - 14 PB - MDPI CY - Basel ER - TY - CHAP A1 - Bogdanovs, Arturs A1 - Krievs, Oskars A1 - Pforr, Johannes T1 - Wide Bandgap SiC and GaN Semiconductor Performance Evaluation in a 3-Phase 3-Level NPC Inverter for Transportation Application T2 - 2022 IEEE 63th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON): Annual International Scientific Conference on Power and Electrical Engineering: Conference Proceedings UR - https://doi.org/10.1109/RTUCON56726.2022.9978767 KW - wide bandgap semiconductors KW - SiC MOSFET KW - GaN FET KW - multilevel inverter KW - transportation application KW - semiconductor comparison Y1 - 2022 UR - https://doi.org/10.1109/RTUCON56726.2022.9978767 SN - 978-1-6654-6558-8 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Mohan, Nihesh A1 - Bhogaraju, Sri Krishna A1 - Lysien, Mateusz A1 - Schneider, Ludovic A1 - Granek, Filip A1 - Lux, Kerstin A1 - Elger, Gordon T1 - Drop feature optimization for fine trace inkjet printing T2 - 2021 23rd European Microelectronics and Packaging Conference & Exhibition (EMPC): Technical Papers UR - https://doi.org/10.23919/EMPC53418.2021.9585004 KW - inkjet printing KW - Ag nanoparticles KW - fine trace KW - surface interactions KW - drop feature KW - ink properties KW - sintering Y1 - 2021 UR - https://doi.org/10.23919/EMPC53418.2021.9585004 SN - 978-0-9568086-7-7 PB - IEEE CY - Piscataway ER - TY - JOUR A1 - Kettelgerdes, Marcel A1 - Elger, Gordon T1 - In-Field Measurement and Methodology for Modeling and Validation of Precipitation Effects on Solid-State LiDAR Sensors JF - IEEE Journal of Radio Frequency Identification UR - https://doi.org/10.1109/JRFID.2023.3234999 KW - LiDAR KW - adverse weather KW - sensor model KW - automotive KW - simulation KW - virtual validation KW - ROS KW - ADAS Y1 - 2023 UR - https://doi.org/10.1109/JRFID.2023.3234999 SN - 2469-7281 VL - 7 SP - 192 EP - 202 PB - Institute of Electrical and Electronics Engineers (IEEE) CY - New York ER - TY - CHAP A1 - Nachtsheim, Martin A1 - Grund, Karina A1 - Endisch, Christian A1 - Kennel, Ralph T1 - Online Identification of Induction Machine Parameter Deviations for Aging Detection - A Comparative Study Using Recursive Least Squares Algorithm and Extended Kalman Filter T2 - 2023 IEEE Transportation Electrification Conference & Expo (ITEC) UR - https://doi.org/10.1109/ITEC55900.2023.10186964 KW - Induction Machine KW - Online Parameter Identification KW - Extended Kalman Filter KW - Recursive Least Squares Algorithm KW - Aging Detection Y1 - 2023 UR - https://doi.org/10.1109/ITEC55900.2023.10186964 SN - 979-8-3503-9742-0 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Bhogaraju, Sri Krishna A1 - Schmid, Maximilian A1 - Kotadia, Hiren R. A1 - Conti, Fosca A1 - Elger, Gordon T1 - Highly reliable die-attach bonding with etched brass flakes T2 - 2021 23rd European Microelectronics and Packaging Conference & Exhibition (EMPC): Technical Papers UR - https://doi.org/10.23919/EMPC53418.2021.9584967 KW - sintering KW - etched brass KW - flakes KW - reliability KW - LED KW - die-attach KW - in-situ copper oxide reduction KW - transient thermal analysis Y1 - 2021 UR - https://doi.org/10.23919/EMPC53418.2021.9584967 SN - 978-0-9568086-7-7 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Steinberger, Fabian A1 - Bhogaraju, Sri Krishna A1 - Elger, Gordon T1 - Correlation between the characteristics of printed sinter paste and the quality of sintered interconnects through non-destructive analysis techniques T2 - NordPac 2023 Annual Microelectronics and Packaging Conference and Exhibition: Reviewed Papers UR - https://doi.org/10.23919/NordPac58023.2023.10186250 KW - profilometry KW - sinter paste KW - interconnect KW - SAM Y1 - 2023 UR - https://doi.org/10.23919/NordPac58023.2023.10186250 SN - 978-91-89821-06-4 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Kettelgerdes, Marcel A1 - Elger, Gordon T1 - Modeling Methodology and In-field Measurement Setup to Develop Empiric Weather Models for Solid-State LiDAR Sensors T2 - 2022 IEEE 2nd International Conference on Digital Twins and Parallel Intelligence (DTPI) UR - https://doi.org/10.1109/DTPI55838.2022.9998918 KW - LiDAR KW - adverse weather KW - sensor model KW - auto-motive KW - simulation KW - virtual validation KW - ROS KW - ADAS Y1 - 2022 UR - https://doi.org/10.1109/DTPI55838.2022.9998918 SN - 978-1-6654-9227-0 PB - IEEE CY - Piscataway ER -