TY - CHAP A1 - Bilal, Mühenad A1 - Kancharana, Sunil A1 - Mayer, Christian A1 - Bregulla, Markus A1 - Ziębiński, Adam A1 - Cupek, Rafal ED - Osten, Wolfgang ED - Nikolaev, Dmitry ED - Zhou, Jianhong T1 - Image-based damage detection on TiN-coated milling tools by using a multi-light scattering illumination technique T2 - Fourteenth International Conference on Machine Vision (ICMV 2021) UR - https://doi.org/10.1117/12.2623140 Y1 - 2022 UR - https://doi.org/10.1117/12.2623140 SN - 978-1-5106-5045-9 SN - 978-1-5106-5044-2 PB - SPIE CY - Bellingham ER -