TY - CHAP A1 - Mathias, Selvine George A1 - Schmied, Sebastian A1 - Großmann, Daniel A1 - Mueller, Ralph A1 - Mroß, Björn T1 - A Compliance Testing Structure for Implementation of Industry Standards through OPC UA T2 - Proceedings 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) UR - https://doi.org/10.1109/ETFA46521.2020.9212119 KW - OPC UA KW - compliance testing KW - information models KW - servers KW - clients Y1 - 2020 UR - https://doi.org/10.1109/ETFA46521.2020.9212119 SN - 978-1-7281-8956-7 SP - 1091 EP - 1094 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Knollmeyer, Simon A1 - Mroß, Björn A1 - Mueller, Ralph A1 - Großmann, Daniel T1 - Ontology based knowledge graph for information and knowledge management in factory planning T2 - 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA) UR - https://doi.org/10.1109/ETFA54631.2023.10275409 Y1 - 2023 UR - https://doi.org/10.1109/ETFA54631.2023.10275409 SN - 979-8-3503-3991-8 PB - IEEE CY - Piscataway ER -