TY - CHAP A1 - Kampa, Thomas A1 - El-Ankah, Amer A1 - Großmann, Daniel ED - Dörksen, Helene ED - Scanzio, Stefano ED - Jasperneite, Jürgen ED - Wisniewski, Lukasz ED - Man, Kim Fung ED - Sauter, Thilo ED - Seno, Lucia ED - Trsek, Henning ED - Vyatkin, Valeriy T1 - High Availability for virtualized Programmable Logic Controllers with Hard Real-Time Requirements on Cloud Infrastructures T2 - 2023 IEEE 21st International Conference on Industrial Informatics (INDIN) UR - https://doi.org/10.1109/INDIN51400.2023.10218014 KW - RDMA KW - vPLC KW - state synchronization Y1 - 2023 UR - https://doi.org/10.1109/INDIN51400.2023.10218014 SN - 978-1-6654-9313-0 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Knollmeyer, Simon A1 - Mroß, Björn A1 - Mueller, Ralph A1 - Großmann, Daniel T1 - Ontology based knowledge graph for information and knowledge management in factory planning T2 - 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA) UR - https://doi.org/10.1109/ETFA54631.2023.10275409 Y1 - 2023 UR - https://doi.org/10.1109/ETFA54631.2023.10275409 SN - 979-8-3503-3991-8 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Kampa, Thomas A1 - Großmann, Daniel T1 - Half&Half: Intra-Flow Load Balancing and High Availability for Edge Cloud-enabled Manufacturing T2 - 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA) UR - https://doi.org/10.1109/ETFA54631.2023.10275483 Y1 - 2023 UR - https://doi.org/10.1109/ETFA54631.2023.10275483 SN - 979-8-3503-3991-8 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Nowacki, Natalie Samanta A1 - Mueller, Ralph A1 - Großmann, Daniel A1 - Lueder, Arndt T1 - Approach for identifying data usage information objects for the later implementation in production environments BT - Enabling a logic for the information modelling based on use cases using a conversation concept T2 - 2023 The 10th International Conference on Industrial Engineering and Applications (Europe), ICIEA-EU 2023 UR - https://doi.org/10.1145/3587889.3587915 Y1 - 2023 UR - https://doi.org/10.1145/3587889.3587915 SN - 978-1-4503-9852-7 SP - 169 EP - 175 PB - ACM CY - New York ER -