TY - CHAP A1 - Mayer, Sebastian A1 - Arnet, Christian A1 - Gankin, Dennis A1 - Endisch, Christian T1 - Standardized framework for evaluating centralized and decentralized control systems in modular assembly systems T2 - 2019 IEEE International Conference on Systems, Man and Cybernetics (SMC) UR - https://doi.org/10.1109/SMC.2019.8914314 KW - virtual commissioning KW - cyber-physical production system KW - digital manufacturing KW - scheduling KW - production control KW - multi-agent system KW - modular assembly system Y1 - 2019 UR - https://doi.org/10.1109/SMC.2019.8914314 SN - 978-1-7281-4569-3 SP - 113 EP - 119 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Mayer, Sebastian A1 - Gankin, Dennis A1 - Arnet, Christian A1 - Endisch, Christian T1 - Adaptive production control with negotiating agents in modular assembly systems T2 - 2019 IEEE International Conference on Systems, Man and Cybernetics (SMC) UR - https://doi.org/10.1109/SMC.2019.8914498 KW - multi-agent system KW - negotiation-based coordination KW - intelligent manufacturing KW - production scheduling KW - production control KW - modular assembly system Y1 - 2019 UR - https://doi.org/10.1109/SMC.2019.8914498 SN - 978-1-7281-4569-3 SP - 120 EP - 127 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Gankin, Dennis A1 - Mayer, Sebastian A1 - Zinn, Jonas A1 - Vogel-Heuser, Birgit A1 - Endisch, Christian T1 - Modular Production Control with Multi-Agent Deep Q-Learning T2 - Proceedings: 2021 26th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) UR - https://doi.org/10.1109/ETFA45728.2021.9613177 Y1 - 2021 UR - https://doi.org/10.1109/ETFA45728.2021.9613177 SN - 978-1-7281-2989-1 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Bilal, Mühenad A1 - Mayer, Christian A1 - Kancharana, Sunil A1 - Bregulla, Markus A1 - Cupek, Rafal A1 - Ziębiński, Adam ED - Bădică, Costin ED - Treur, Jan ED - Benslimane, Djamal ED - Hnatkowska, Bogumiła ED - Krótkiewicz, Marek T1 - Damage Detection of Coated Milling Tools Using Images Captured by Cylindrical Shaped Enclosure Measurement Setup T2 - Advances in Computational Collective Intelligence. 14th International Conference, ICCCI 2022, Hammamet, Tunisia, September 28–30, 2022, Proceedings UR - https://doi.org/10.1007/978-3-031-16210-7_21 KW - quality inspection KW - damage detection KW - image processing KW - tool regrinding KW - measurement setup Y1 - 2022 UR - https://doi.org/10.1007/978-3-031-16210-7_21 SN - 978-3-031-16209-1 SN - 978-3-031-16210-7 SP - 264 EP - 272 PB - Springer CY - Cham ER - TY - CHAP A1 - Mayer, Sebastian A1 - Höhme, Nikolas A1 - Gankin, Dennis A1 - Endisch, Christian T1 - Adaptive Production Control in a Modular Assembly System – Towards an Agent-based Approach T2 - Proceedings, 2019 IEEE 17th International Conference on Industrial Informatics (INDIN) UR - https://doi.org/10.1109/INDIN41052.2019.8972152 KW - intelligent manufacturing KW - scheduling KW - production control KW - multi-agent system KW - modular assembly system KW - automated guided vehicles Y1 - 2020 UR - https://doi.org/10.1109/INDIN41052.2019.8972152 SN - 978-1-7281-2927-3 SP - 45 EP - 52 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Mayer, Sebastian A1 - Endisch, Christian T1 - Adaptive production control in a modular assembly system based on partial look-ahead scheduling T2 - Proceedings, 2019 IEEE International Conference on Mechatronics (ICM) UR - https://doi.org/10.1109/ICMECH.2019.8722904 KW - scheduling KW - production control KW - production planning KW - modular assembly system KW - automated guided vehicles KW - cyber-physical systems KW - intelligent manufacturing KW - genetic algorithm Y1 - 2019 UR - https://doi.org/10.1109/ICMECH.2019.8722904 SN - 978-1-5386-6959-4 SP - 293 EP - 300 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Bilal, Mühenad A1 - Kancharana, Sunil A1 - Mayer, Christian A1 - Bregulla, Markus A1 - Ziębiński, Adam A1 - Cupek, Rafal ED - Osten, Wolfgang ED - Nikolaev, Dmitry ED - Zhou, Jianhong T1 - Image-based damage detection on TiN-coated milling tools by using a multi-light scattering illumination technique T2 - Fourteenth International Conference on Machine Vision (ICMV 2021) UR - https://doi.org/10.1117/12.2623140 Y1 - 2022 UR - https://doi.org/10.1117/12.2623140 SN - 978-1-5106-5045-9 SN - 978-1-5106-5044-2 PB - SPIE CY - Bellingham ER -