@inproceedings{LiuContiBhogarajuetal.2021, author = {Liu, E and Conti, Fosca and Bhogaraju, Sri Krishna and Elger, Gordon}, title = {Simulations and experiments to analyze stress phenomena in soldered and sintered interconnections between silicon nitride chips and copper substrates}, booktitle = {2021 22nd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-6654-1373-2}, doi = {https://doi.org/10.1109/EuroSimE52062.2021.9410869}, year = {2021}, language = {en} } @inproceedings{PascucciContiBhogarajuetal.2021, author = {Pascucci, Jacopo and Conti, Fosca and Bhogaraju, Sri Krishna and Signorini, Raffaella and Liu, E and Pedron, Danilo and Elger, Gordon}, title = {Micro-Raman to detect stress phenomena in Si-chips bonded onto Cu substrates}, booktitle = {Integrated Optics: Design, Devices, Systems and Applications VI}, editor = {Cheben, Pavel and Čtyrok{\´y}, Jiř{\´i} and Molina-Fern{\´a}ndez, I{\~n}igo}, publisher = {SPIE}, address = {Bellingham}, isbn = {978-1-5106-4385-7}, doi = {https://doi.org/10.1117/12.2576414}, year = {2021}, language = {en} } @inproceedings{ContiLiuBhogarajuetal.2020, author = {Conti, Fosca and Liu, E and Bhogaraju, Sri Krishna and Wunderle, Bernhard and Elger, Gordon}, title = {Finite Element simulations and Raman measurements to investigate thermomechanical stress in GaN-LEDs}, booktitle = {2020 IEEE 8th Electronics System-Integration Technology Conference (ESTC)}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-7281-6293-5}, doi = {https://doi.org/10.1109/ESTC48849.2020.9229843}, year = {2020}, language = {en} } @inproceedings{ContiLiuBhogarajuetal.2021, author = {Conti, Fosca and Liu, E and Bhogaraju, Sri Krishna and Lenz, Christoph and Seitz, Roland and Elger, Gordon}, title = {Stress evaluations of silicon nitride chips bonded onto copper substrates via SAC soldering, AuSn soldering, and copper sintering}, booktitle = {2020 26th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-7281-7643-7}, doi = {https://doi.org/10.1109/THERMINIC49743.2020.9420523}, pages = {204 -- 208}, year = {2021}, language = {en} } @inproceedings{LiuSchmidBhogarajuetal.2021, author = {Liu, E and Schmid, Maximilian and Bhogaraju, Sri Krishna and Elger, Gordon}, title = {Advanced location resolved transient thermal analysis}, booktitle = {2020 26th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-7281-7643-7}, doi = {https://doi.org/10.1109/THERMINIC49743.2020.9420538}, pages = {191 -- 196}, year = {2021}, language = {en} } @inproceedings{ZippeliusHanssLiuetal.2020, author = {Zippelius, Andreas and Hanss, Alexander and Liu, E and Schmid, Maximilian and P{\´e}rez-Vel{\´a}zquez, Judith and Elger, Gordon}, title = {Comparing prediction methods for LED failure measured with Transient Thermal Analysis}, booktitle = {2020 21st International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-7281-6049-8}, doi = {https://doi.org/10.1109/EuroSimE48426.2020.9152657}, year = {2020}, language = {en} } @inproceedings{HanssLiuAbdullahetal.2019, author = {Hanss, Alexander and Liu, E and Abdullah, Muhammad Rizwan and Elger, Gordon}, title = {Failure Identification in LED packages by Transient Thermal Analysis and Calibrated FE Models}, booktitle = {2019 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-5386-8040-7}, doi = {https://doi.org/10.1109/EuroSimE.2019.8724558}, year = {2019}, language = {en} } @inproceedings{ElgerLiuContietal.2019, author = {Elger, Gordon and Liu, E and Conti, Fosca and Signorini, Raffaella and Brugnolotto, Enrico and Bhogaraju, Sri Krishna}, title = {Modelling Thermo-Mechanical Stress in GaN-LEDs Soldered on Copper Substrate with Simulations Validated by Raman Experiments}, booktitle = {2019 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-5386-8040-7}, doi = {https://doi.org/10.1109/EuroSimE.2019.8724533}, year = {2019}, language = {en} } @inproceedings{SignoriniContiBrugnolottoetal.2019, author = {Signorini, Raffaella and Conti, Fosca and Brugnolotto, Enrico and Pedron, Danilo and Liu, E and Bhogaraju, Sri Krishna and Elger, Gordon}, title = {Thermomechanical local stress in assembled GaN LEDs investigated by Raman optical spectroscopy}, booktitle = {Integrated Optics: Design, Devices, Systems, and Applications V}, editor = {Cheben, Pavel and Čtyrok{\´y}, Jiř{\´i} and Molina-Fern{\´a}ndez, I{\~n}igo}, publisher = {SPIE}, address = {Bellingham}, isbn = {978-1-5106-2729-1}, doi = {https://doi.org/10.1117/12.2520992}, year = {2019}, language = {en} } @inproceedings{BrugnolottoBhogarajuLiuetal.2019, author = {Brugnolotto, Enrico and Bhogaraju, Sri Krishna and Liu, E and Conti, Fosca and Pedron, Danilo and Signorini, Raffaella and Elger, Gordon}, title = {Investigation of thermomechanical local stress induced in assembled GaN LEDs}, booktitle = {2019 25th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-7281-2078-2}, doi = {https://doi.org/10.1109/THERMINIC.2019.8923629}, year = {2019}, language = {en} } @inproceedings{SchmidHermannLiuetal.2022, author = {Schmid, Maximilian and Hermann, Joseph and Liu, E and Elger, Gordon}, title = {Correlation of Scanning Acoustic Microscopy and Transient Thermal Analysis to Identify Crack Growth in Solder Joints}, booktitle = {Proceedings of the Twenty First InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems: ITherm 2022}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-6654-8503-6}, doi = {https://doi.org/10.1109/iTherm54085.2022.9899664}, year = {2022}, language = {en} } @inproceedings{LiuBhogarajuLuxetal.2022, author = {Liu, E and Bhogaraju, Sri Krishna and Lux, Kerstin and Elger, Gordon and Mou, Rokeya Mumtahana}, title = {Investigation Of Stress Generated By Interconnection Processes With Micro-Raman Spectroscopy (μRS)}, booktitle = {Proceedings IEEE 72nd Electronic Components and Technology Conference: ECTC 2022}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-6654-7943-1}, doi = {https://doi.org/10.1109/ECTC51906.2022.00123}, pages = {739 -- 745}, year = {2022}, language = {en} } @inproceedings{BhogarajuSchmidLiuetal.2022, author = {Bhogaraju, Sri Krishna and Schmid, Maximilian and Liu, E and Saccon, Rodolfo and Elger, Gordon and Klassen, Holger and M{\"u}ller, Klaus and Pirzer, Georg}, title = {Low cost copper based sintered interconnect material for optoelectronics packaging}, booktitle = {2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-6654-7943-1}, doi = {https://doi.org/10.1109/ECTC51906.2022.00270}, pages = {1720 -- 1725}, year = {2022}, language = {en} } @inproceedings{ContiLuxBhogarajuetal.2021, author = {Conti, Fosca and Lux, Kerstin and Bhogaraju, Sri Krishna and Liu, E and Lenz, Christoph and Seitz, Roland and Elger, Gordon}, title = {Raman spectroscopy to investigate gallium nitride light emitting diodes after assembling onto copper substrates}, booktitle = {Optical Sensors 2021}, editor = {Baldini, Francesco and Homola, Jiri and Lieberman, Robert A.}, publisher = {SPIE}, address = {Bellingham}, isbn = {978-1-5106-4379-6}, doi = {https://doi.org/10.1117/12.2591947}, year = {2021}, language = {en} } @inproceedings{LiuMohdSteinbergeretal.2024, author = {Liu, E and Mohd, Zubair Akhtar and Steinberger, Fabian and Wunderle, Bernhard and Elger, Gordon}, title = {Using µ-RAMAN Spectroscopy to Inspect Sintered Interconnects}, booktitle = {2024 IEEE 10th Electronics System-Integration Technology Conference (ESTC), Proceedings}, publisher = {IEEE}, address = {Piscataway}, isbn = {979-8-3503-9036-0}, doi = {https://doi.org10.1109/ESTC60143.2024.10712149}, year = {2024}, language = {en} }