@article{MohanAhuirTorresBhogarajuetal.2024, author = {Mohan, Nihesh and Ahuir-Torres, Juan Ignacio and Bhogaraju, Sri Krishna and Webler, Ralf and Kotadia, Hiren R. and Erdogan, H{\"u}seyin and Elger, Gordon}, title = {Decomposition mechanism and morphological evolution of in situ realized Cu nanoparticles in Cu complex inks}, volume = {48}, journal = {New Journal of Chemistry}, number = {15}, publisher = {RSC}, address = {London}, issn = {1369-9261}, doi = {https://doi.org/10.1039/D3NJ05185D}, pages = {6796 -- 6808}, year = {2024}, language = {en} } @inproceedings{MohanAhuirTorresBhogarajuetal.2024, author = {Mohan, Nihesh and Ahuir-Torres, Juan Ignacio and Bhogaraju, Sri Krishna and Kotadia, Hiren R. and Elger, Gordon}, title = {Rapid Sintering of Inkjet Printed Cu Complex Inks Using Laser in Air}, booktitle = {2023 24th European Microelectronics and Packaging Conference \& Exhibition (EMPC)}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-0-9568086-9-1}, doi = {https://doi.org/10.23919/EMPC55870.2023.10418323}, year = {2024}, language = {en} } @inproceedings{BhogarajuUgoliniBelponeretal.2024, author = {Bhogaraju, Sri Krishna and Ugolini, Francesco and Belponer, Federico and Greci, Alessio and Elger, Gordon}, title = {Reliability of Copper Sintered Interconnects Under Extreme Thermal Shock Conditions}, booktitle = {2023 24th European Microelectronics and Packaging Conference \& Exhibition (EMPC)}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-0-9568086-9-1}, doi = {https://doi.org/10.23919/EMPC55870.2023.10418348}, year = {2024}, language = {en} } @inproceedings{BhogarajuMohanSteinbergeretal.2024, author = {Bhogaraju, Sri Krishna and Mohan, Nihesh and Steinberger, Fabian and Erdogan, H{\"u}seyin and Hadrava, Philipp and Elger, Gordon}, title = {Novel Low Temperature and Low Pressure Sintering of ADAS Radar Sensor Antenna Stack}, booktitle = {2023 24th European Microelectronics and Packaging Conference \& Exhibition (EMPC)}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-0-9568086-9-1}, doi = {https://doi.org/10.23919/EMPC55870.2023.10418277}, year = {2024}, language = {en} } @inproceedings{AhuirTorresBhogarajuWestetal.2024, author = {Ahuir-Torres, Juan Ignacio and Bhogaraju, Sri Krishna and West, Geoff and Elger, Gordon and Kotadia, Hiren R.}, title = {Understanding Cu Sintering and Its Role on Corrosion Behaviour for High-Temperature Microelectronic Application}, booktitle = {2023 24th European Microelectronics and Packaging Conference \& Exhibition (EMPC)}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-0-9568086-9-1}, doi = {https://doi.org/10.23919/EMPC55870.2023.10418365}, year = {2024}, language = {en} } @article{ElgerBhogarajuSchneiderRamelow2024, author = {Elger, Gordon and Bhogaraju, Sri Krishna and Schneider-Ramelow, Martin}, title = {Hybrid Cu sinter paste for low temperature bonding of bare semiconductors}, volume = {2024}, pages = {136973}, journal = {Materials Letters}, number = {372}, publisher = {Elsevier}, address = {New York}, issn = {1873-4979}, doi = {https://doi.org/10.1016/j.matlet.2024.136973}, year = {2024}, abstract = {A novel hybrid copper paste was developed for low temperature sintering of bare semiconductors. Cu(II) formate (Cu(for)) is complexed in amino-2-propanol (A2P) and added to a paste of etched brass micro flakes. A two-step sintering process is applied: The paste is printed and dried at 120 °C under formic acid (FA) enriched N2 atmosphere (FAN2) for 5 min. Afterwards, bare semiconductors are placed and sintered at 250 °C for 5 min applying a bonding pressure of 20 MPa/10 MPa. By the thermal decomposition of the Cu(for) atomic Cu is released and forms in-situ Cu-nanoparticles. An interconnect is realized with shear strength >100 MPa.}, language = {en} } @inproceedings{ParetBhogarajuBusseetal.2024, author = {Paret, Paul and Bhogaraju, Sri Krishna and Busse, Dirk and Dahlb{\"u}dding, Alexander and Elger, Gordon and Narumanchi, Sreekant}, title = {Thermomechanical Degradation of Sintered Copper under High-Temperature Thermal Shock}, booktitle = {Proceedings: IEEE 74th Electronic Components and Technology Conference, ECTC 2024}, publisher = {IEEE}, address = {Piscataway}, isbn = {979-8-3503-7598-5}, doi = {https://doi.org/10.1109/ECTC51529.2024.00196}, pages = {1219 -- 1224}, year = {2024}, language = {en} } @inproceedings{ContiLuxBhogarajuetal.2021, author = {Conti, Fosca and Lux, Kerstin and Bhogaraju, Sri Krishna and Liu, E and Lenz, Christoph and Seitz, Roland and Elger, Gordon}, title = {Raman spectroscopy to investigate gallium nitride light emitting diodes after assembling onto copper substrates}, booktitle = {Optical Sensors 2021}, editor = {Baldini, Francesco and Homola, Jiri and Lieberman, Robert A.}, publisher = {SPIE}, address = {Bellingham}, isbn = {978-1-5106-4379-6}, doi = {https://doi.org/10.1117/12.2591947}, year = {2021}, language = {en} } @inproceedings{PandeyBhogarajuLuxetal.2022, author = {Pandey, Amit and Bhogaraju, Sri Krishna and Lux, Kerstin and Elger, Gordon}, title = {Analysis of stress in spherically bent thinned image sensors}, booktitle = {2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-6654-5836-8}, doi = {https://doi.org/10.1109/EuroSimE54907.2022.9758847}, year = {2022}, language = {en} }