@inproceedings{SchmidBhogarajuElger2019, author = {Schmid, Maximilian and Bhogaraju, Sri Krishna and Elger, Gordon}, title = {Automatic transient thermal impedance tester for quality inspection of soldered and sintered power electronic devices on panel and tile level}, booktitle = {2019 IEEE 69th Electronic Components and Technology Conference (ECTC)}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-7281-1499-6}, doi = {https://doi.org/10.1109/ECTC.2019.00320}, pages = {2324 -- 2330}, year = {2019}, language = {en} } @inproceedings{SchmidHermannBhogarajuetal.2022, author = {Schmid, Maximilian and Hermann, Joseph and Bhogaraju, Sri Krishna and Elger, Gordon}, title = {Reliability of SAC Solders under Low and High Stress Conditions}, booktitle = {2022 IEEE 9th Electronics System-Integration Technology Conference (ESTC)}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-6654-8947-8}, doi = {https://doi.org/10.1109/ESTC55720.2022.9939394}, pages = {553 -- 559}, year = {2022}, language = {en} } @inproceedings{LiuBhogarajuLuxetal.2022, author = {Liu, E and Bhogaraju, Sri Krishna and Lux, Kerstin and Elger, Gordon and Mou, Rokeya Mumtahana}, title = {Investigation Of Stress Generated By Interconnection Processes With Micro-Raman Spectroscopy (μRS)}, booktitle = {Proceedings IEEE 72nd Electronic Components and Technology Conference: ECTC 2022}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-6654-7943-1}, doi = {https://doi.org/10.1109/ECTC51906.2022.00123}, pages = {739 -- 745}, year = {2022}, language = {en} } @inproceedings{SacconBeninBhogarajuetal.2022, author = {Saccon, Rodolfo and Benin, Alice and Bhogaraju, Sri Krishna and Elger, Gordon}, title = {Effect of binders on the performance of copper sintering pastes}, booktitle = {2022 International Conference on Electronics Packaging (ICEP 2022)}, publisher = {IEEE}, address = {Piscataway (NJ)}, isbn = {978-4-9911911-3-8}, doi = {https://doi.org/10.23919/ICEP55381.2022.9795555}, pages = {71 -- 72}, year = {2022}, language = {en} } @inproceedings{HanssSchmidBhogarajuetal.2018, author = {Hanss, Alexander and Schmid, Maximilian and Bhogaraju, Sri Krishna and Conti, Fosca and Elger, Gordon}, title = {Reliability of sintered and soldered high power chip size packages and flip chip LEDs}, booktitle = {ECTC - The 2018 IEEE 68th Electronic Components and Technology Conference: Proceedings}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-5386-5000-4}, doi = {https://doi.org/10.1109/ECTC.2018.00312}, pages = {2080 -- 2088}, year = {2018}, language = {en} } @inproceedings{BhogarajuMokhtariPascuccietal.2020, author = {Bhogaraju, Sri Krishna and Mokhtari, Omid and Pascucci, Jacopo and Hanss, Alexander and Schmid, Maximilian and Conti, Fosca and Elger, Gordon}, title = {Hybrid Cu particle paste with surface-modified particles for high temperature electronics packaging}, booktitle = {Proceedings 22nd European Microelectronics and Packaging Conference, EMPC}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-7281-6291-1}, doi = {https://doi.org/10.23919/EMPC44848.2019.8951887}, year = {2020}, language = {en} } @inproceedings{HanssSchmidBhogarajuetal.2018, author = {Hanss, Alexander and Schmid, Maximilian and Bhogaraju, Sri Krishna and Conti, Fosca and Elger, Gordon}, title = {Process development and reliability of sintered high power chip size packages and flip chip LEDs}, booktitle = {2018 International Conference on Electronics Packaging and iMAPS All Asia Conference (ICEP-IAAC)}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-4-9902-1885-0}, doi = {https://doi.org/10.23919/ICEP.2018.8374351}, pages = {479 -- 484}, year = {2018}, language = {en} } @inproceedings{BhogarajuHanssSchmidetal.2018, author = {Bhogaraju, Sri Krishna and Hanss, Alexander and Schmid, Maximilian and Elger, Gordon and Conti, Fosca}, title = {Evaluation of silver and copper sintering of first level interconnects for high power LEDs}, booktitle = {2018 7th Electronic System-Integration Technology Conference (ESTC)}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-5386-6814-6}, doi = {https://doi.org/10.1109/ESTC.2018.8546499}, year = {2018}, language = {en} } @article{ContiHanssMokhtarietal.2018, author = {Conti, Fosca and Hanss, Alexander and Mokhtari, Omid and Bhogaraju, Sri Krishna and Elger, Gordon}, title = {Formation of tin-based crystals from a SnAgCu alloy under formic acid vapor}, volume = {42}, journal = {New Journal of Chemistry}, number = {23}, publisher = {RSC}, address = {London}, issn = {1369-9261}, doi = {https://doi.org/10.1039/C8NJ04173C}, pages = {19232 -- 19236}, year = {2018}, language = {en} } @inproceedings{BhogarajuSchmidLiuetal.2022, author = {Bhogaraju, Sri Krishna and Schmid, Maximilian and Liu, E and Saccon, Rodolfo and Elger, Gordon and Klassen, Holger and M{\"u}ller, Klaus and Pirzer, Georg}, title = {Low cost copper based sintered interconnect material for optoelectronics packaging}, booktitle = {2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-6654-7943-1}, doi = {https://doi.org/10.1109/ECTC51906.2022.00270}, pages = {1720 -- 1725}, year = {2022}, language = {en} } @inproceedings{SignoriniPedronContietal.2018, author = {Signorini, Raffaella and Pedron, Danilo and Conti, Fosca and Hanss, Alexander and Bhogaraju, Sri Krishna and Elger, Gordon}, title = {Thermomechanical Stress in GaN LED Soldered on Copper Substrate Evaluated by Raman Measurements and Computer Modelling}, booktitle = {2018 24rd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-5386-6759-0}, doi = {https://doi.org/10.1109/THERMINIC.2018.8593304}, year = {2018}, language = {en} }