TY - CONF A1 - Bilal, Mühenad A1 - Kancharana, Sunil A1 - Mayer, Christian A1 - Bregulla, Markus A1 - Ziębiński, Adam A1 - Cupek, Rafal A2 - Osten, Wolfgang A2 - Nikolaev, Dmitry A2 - Zhou, Jianhong T1 - Image-based damage detection on TiN-coated milling tools by using a multi-light scattering illumination technique BT - Fourteenth International Conference on Machine Vision (ICMV 2021) Y1 - 2022 UR - https://opus4.kobv.de/opus4-haw/frontdoor/index/index/docId/2748 UR - https://doi.org/10.1117/12.2623140 SN - 978-1-5106-5045-9 SN - 978-1-5106-5044-2 PB - SPIE CY - Bellingham ER -