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Industrial computed tomography (CT) is increasingly gaining in importance as a nondestructive testing method (NDT). As with any other NDT method, the requirement for its performance and detection capabilities to be assessed increases as it is used more frequently. Simultaneously, it is becoming important for users to be able to quantitatively measure and compare the suitability of systems available on the market for their own applications. This probability of detection (POD) method makes it possible to create application-specific POD curves for CT systems using a specially-developed POD test specimen. Within the context of this study, a micro-CT scanner with an accelerating voltage of 225 kV and specimens of stainless steel with thicknesses of 1,050 and 2,050 μm was assessed as an example. When developing this method, special value was placed on reproducibility and universal applicability.
In this paper, we present two nondestructive characterization methods for the detection of voids in rear local contacts of passivated emitter and rear-type solar cells, namely scanning acoustic microscopy and computer tomography. We compare both methods and include a comparison with electroluminescence measurements. It is shown in this paper that voids can easily be detected with both measurement types without any sample preparation. We found a good match of scanning acoustic microscopy (SAM) and computer tomography (CT), which is presented for this purpose for the first time. The investigation was carried out for different aluminum pastes.