Preparation and microstructure analysis of Mo/Si multilayers as x-ray optical elements
Author: | Andreas Kloidt, Hans-Jürgen Stock, Ulf Kleineberg, Thorsten DöhringORCiD, Michael Pröpper, Kerstin Hilgers, Bernhard Heidemann, Thorsten Tappe, Bernt Schmiedeskamp, Ulrich Heinzmann |
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Parent Title (English): | Proceedings of Symposium on Surface Science 1993 |
Document Type: | Conference Proceeding |
Language: | English |
Year of Completion: | 1993 |
Release Date: | 2019/07/09 |
GND Keyword: | Röntgenspiegel |
Volume: | 1993 |
First Page: | 115 |
Last Page: | 120 |
Urheberrecht: | 0 |
research focus : | Materials / Innovative Material Processing |
Materials / Material Testing & Sensor Technology | |
Licence (German): | Keine Lizenz - es gilt das deutsche Urheberrecht |