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Nondestructive Characterization of Voids in Rear Local Contacts of PERC-Type Solar Cells

  • In this paper, we present two nondestructive characterization methods for the detection of voids in rear local contacts of passivated emitter and rear-type solar cells, namely scanning acoustic microscopy and computer tomography. We compare both methods and include a comparison with electroluminescence measurements. It is shown in this paper that voids can easily be detected with both measurement types without any sample preparation. We found a good match of scanning acoustic microscopy (SAM) and computer tomography (CT), which is presented for this purpose for the first time. The investigation was carried out for different aluminum pastes.

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Author:Katharina Dressler, Miriam Rauer, Michael Kaloudis, Stefan Dauwe, Axel Herguth, Giso Hahn
DOI:https://doi.org/10.1109/JPHOTOV.2014.2359745
Parent Title (German):IEEE Journal of Photovoltaics
Document Type:Article
Language:German
Year of Completion:2014
Date of first Publication:2014/12/18
Release Date:2015/06/08
GND Keyword:Solarzelle
Volume:2015
Issue:1
First Page:70
Last Page:76
Urheberrecht:1
research focus :Intelligent Systems / Electronics and Electric Drives
Materials / Clean Tech
Materials / Material Testing & Sensor Technology
Licence (German):Keine Lizenz - es gilt das deutsche Urheberrecht
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