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Computed-Tomography-Based Analysis of Voids in SnBi57Ag1 Solder Joints and Their Influence on the Reliability

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Metadaten
Author:Miriam Rauer, Antje Volkert, Stefan Härter, Timo Schreck, Michael Kaloudis
Parent Title (English):Journal of Failure Analysis and Prevention
Editor:Michael Stevenson
Document Type:Article
Language:German
Year of Completion:2014
Date of first Publication:2014/03/15
Release Date:2015/06/08
GND Keyword:Computertomographie; Löten
Volume:14
Issue:3
First Page:272
Last Page:281
Urheberrecht:0
research focus :Intelligent Systems / Electronics and Electric Drives
Intelligent Systems / Intelligent Sensors and Signals
Materials / Clean Tech
Materials / Material Testing & Sensor Technology
Licence (German):Keine Lizenz - es gilt das deutsche Urheberrecht
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