TY - JOUR A1 - Amrhein, Sebastian A1 - Rauer, Miriam ED - Meyendorf, Norbert T1 - Characterization of Computer Tomography Scanners Using the Probability of Detection Method JF - Journal of Nondestructive Evaluation N2 - Industrial computed tomography (CT) is increasingly gaining in importance as a nondestructive testing method (NDT). As with any other NDT method, the requirement for its performance and detection capabilities to be assessed increases as it is used more frequently. Simultaneously, it is becoming important for users to be able to quantitatively measure and compare the suitability of systems available on the market for their own applications. This probability of detection (POD) method makes it possible to create application-specific POD curves for CT systems using a specially-developed POD test specimen. Within the context of this study, a micro-CT scanner with an accelerating voltage of 225 kV and specimens of stainless steel with thicknesses of 1,050 and 2,050 μm was assessed as an example. When developing this method, special value was placed on reproducibility and universal applicability. KW - CT, POD, Test Specimen KW - Computertomographie Y1 - 2014 VL - 33 IS - 4 SP - 643 EP - 650 ER - TY - JOUR A1 - Rauer, Miriam A1 - Volkert, Antje A1 - Härter, Stefan A1 - Schreck, Timo A1 - Kaloudis, Michael ED - Stevenson, Michael T1 - Computed-Tomography-Based Analysis of Voids in SnBi57Ag1 Solder Joints and Their Influence on the Reliability JF - Journal of Failure Analysis and Prevention KW - Computertomographie KW - Löten Y1 - 2014 VL - 14 IS - 3 SP - 272 EP - 281 ER - TY - JOUR A1 - Rauer, Miriam A1 - Kaloudis, Michael T1 - Ausfallanalyse an einem Lithium-Ionen Akkumulator JF - Maschinenmarkt KW - Lithium-Ionen-Akkumulator Y1 - 2014 VL - 2014 IS - 2 SP - 45 EP - 46 ER - TY - JOUR A1 - Rauer, Miriam A1 - Kaloudis, Michael T1 - Computertomographie erweitert das Blickfeld JF - Mikroproduktion KW - Computertomographie Y1 - 2014 VL - 2014 IS - 1 SP - 50 EP - 51 ER - TY - JOUR A1 - Dressler, Katharina A1 - Rauer, Miriam A1 - Kaloudis, Michael A1 - Dauwe, Stefan A1 - Herguth, Axel A1 - Hahn, Giso T1 - Nondestructive Characterization of Voids in Rear Local Contacts of PERC-Type Solar Cells JF - IEEE Journal of Photovoltaics N2 - In this paper, we present two nondestructive characterization methods for the detection of voids in rear local contacts of passivated emitter and rear-type solar cells, namely scanning acoustic microscopy and computer tomography. We compare both methods and include a comparison with electroluminescence measurements. It is shown in this paper that voids can easily be detected with both measurement types without any sample preparation. We found a good match of scanning acoustic microscopy (SAM) and computer tomography (CT), which is presented for this purpose for the first time. The investigation was carried out for different aluminum pastes. KW - Solarzelle Y1 - 2014 U6 - https://doi.org/10.1109/JPHOTOV.2014.2359745 VL - 2015 IS - 1 SP - 70 EP - 76 ER - TY - CHAP A1 - Rauer, Miriam A1 - Schreck, Timo A1 - Härter, Stefan A1 - Kaloudis, Michael T1 - The Effect of Thermal Stress on the Reliability of low Ag Solder Joints in High Power LEDs T2 - 20th European Microelectronics and Packaging Conference (EMPC) & Exhibition, 14.-16.09.2015 KW - Lumineszenzdiode KW - Thermische Belastung KW - Zuverlässigkeit KW - Lötverbindung Y1 - 2015 SP - 1 EP - 6 ER - TY - CHAP A1 - Rauer, Miriam A1 - Xu, Ping A1 - Reinhardt, Andreas A1 - Kaloudis, Michael A1 - Franke, Jörg T1 - Einfluss von Poren in Lötverbindungen bei LED-Anwendungen T2 - Elektronische Baugruppen und Leiterplatten – EBL 2016 KW - Lötverbindung KW - Lumineszenzdiode KW - Pore Y1 - 2016 SN - 978-3-8007-4147-2 SP - 135 EP - 139 PB - VDE Verlag CY - Berlin ER - TY - THES A1 - Rauer, Miriam T1 - Der Einfluss von Poren auf die Zuverlässigkeit der Lötverbindungen von Hochleistungs-Leuchtdioden KW - Lötverbindung KW - Lumineszenzdiode Y1 - 2018 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:29-opus4-104749 SN - 978-3-96147-158-4 ER - TY - JOUR A1 - Rauer, Miriam A1 - Schreck, Timo A1 - Kaloudis, Michael T1 - X-Ray Computed Tomography as Supporting Technology in the Failure Analysis of Press-In Connections for Electronic Assemblies JF - Practical Metallography KW - X-ray KW - Fehleranalyse KW - Computertomografie KW - Elektronische Baugruppe Y1 - 2013 VL - 50(2013) IS - 3 SP - 205 EP - 221 ER - TY - JOUR A1 - Rauer, Miriam A1 - Kaloudis, Michael T1 - Hinter der Fassade - Ausfallanalyse an einem Lithium-Ionen Akkumulator mittels CT JF - QZ Qualität und Zuverlässigkeit KW - Ausfallanalyse KW - Lithium-Ionen-Akkumulator KW - Ausfallanalyse Y1 - 2013 VL - 2013 IS - 1 SP - 40 EP - 41 ER -