<?xml version="1.0" encoding="utf-8"?>
<export-example>
  <doc>
    <id>2047</id>
    <completedYear>2022</completedYear>
    <publishedYear/>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>121814S-1</pageFirst>
    <pageLast>121814s-7</pageLast>
    <pageNumber>7</pageNumber>
    <edition/>
    <issue>12181</issue>
    <volume>2022</volume>
    <type>conferenceobject</type>
    <publisherName>SPIE</publisherName>
    <publisherPlace/>
    <creatingCorporation>Osservatorio Astronomico di Brera</creatingCorporation>
    <contributingCorporation>TH Aschaffenburg</contributingCorporation>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2022-09-06</completedDate>
    <publishedDate>2022-08-31</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Upgrade of a laboratory X-ray diffractometer to extend its operating range towards soft energies</title>
    <abstract language="eng">The optical properties of X-ray mirror samples are commonly measured using diffractometers based on laboratory sources; like the Bede D1 diffractometer operating at INAF-OAB. This instrument can generate a collimated X-ray beam up to 60 keV, even though the most interesting energy region for x-ray astronomy applications is usually below 10 keV. In the softest part of this range (below 6 keV), high X-ray absorption in air hinders a full and precise characterization of optical components. In this work, we present an upgrade of the Bede D1 diffractometer that extends the operative range of the&#13;
instrument below 6 keV; this is done by maximizing the flux at lowest energies and by reducing absorption by means of a helium-rich atmosphere.&#13;
The upgraded instrument will be used for the tests of X-ray mirrors with innovative soft X-ray coatings, with potential application to the next generation X-ray telescopes (such as ATHENA and eXTP).</abstract>
    <parentTitle language="eng">Proceedings of SPIE</parentTitle>
    <identifier type="issn">0277-786X</identifier>
    <identifier type="url">https://www.spiedigitallibrary.org/conference-proceedings-of-spie/12181/121814S/Upgrade-of-a-laboratory-x-ray-diffractometer-to-extend-its/10.1117/12.2629940.short</identifier>
    <identifier type="doi">doi: 10.1117/12.2629940</identifier>
    <enrichment key="copyright">1</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <licence>Keine Lizenz - es gilt das deutsche Urheberrecht</licence>
    <author>Giacomo Rivolta</author>
    <author>Stefano Basso</author>
    <author>Marta Maria Civitani</author>
    <author>Vincenzo Cotroneo</author>
    <author>Thorsten Döhring</author>
    <author>Willy-Leopold Michler</author>
    <author>Giovanni Pareschi</author>
    <author>Daniele Spiga</author>
    <author>Manfred Stollenwerk</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>mirror</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>reflectivity</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>refractometer</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>ATHENA</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>swd</type>
      <value>Röntgenspiegel</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>swd</type>
      <value>Diffraktometer</value>
    </subject>
    <collection role="institutes" number="">Internationales Technisches Vertriebsmanagement (Bachelor)</collection>
    <collection role="forschungsschwerpunkte" number="">Material Testing &amp; Sensor Technology</collection>
  </doc>
</export-example>
