<?xml version="1.0" encoding="utf-8"?>
<export-example>
  <doc>
    <id>1332</id>
    <completedYear>2019</completedYear>
    <publishedYear/>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>111191L-1</pageFirst>
    <pageLast>111191L-6</pageLast>
    <pageNumber>111191L</pageNumber>
    <edition/>
    <issue>11119</issue>
    <volume>2019</volume>
    <type>conferenceobject</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation>Max-Planck-Institut für Extraterrestrische Physik</creatingCorporation>
    <contributingCorporation>Technische Hochschule Aschaffenburg</contributingCorporation>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2019-09-20</completedDate>
    <publishedDate>2019-09-09</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">X-ray reflectivity measurements at chromium-iridium tri-layer coatings</title>
    <abstract language="eng">Studying astronomical objects in the X-ray regime, iridium-based layer systems are highly effective reflective&#13;
materials for telescopes mirrors. Aschaffenburg University and the Czech Technical University in Prague jointly developed stress compensated chromium-iridium coatings. To overcome the disturbing reflectivity reduction of the iridium absorption edge around 2 keV photon energy and improve general reflectivity at lower incident energies, thin overcoat layers of chromium have been applied in addition. Corresponding measurements at several X-ray lines have been performed on these samples at the PANTER test facility of the Max-Planck Institute for&#13;
extraterrestrial Physics. A part of the experimental results and their comparison with theoretical simulations&#13;
are presented in this contribution.</abstract>
    <parentTitle language="eng">Proceedings of SPIE</parentTitle>
    <identifier type="doi">http://dx.doi.org/10.1117/12.2530439</identifier>
    <enrichment key="copyright">1</enrichment>
    <licence>Keine Lizenz - es gilt das deutsche Urheberrecht</licence>
    <author>Veronika Stehlikova</author>
    <author>Thorsten Döhring</author>
    <author>Tobias Schäfer</author>
    <author>Manfred Stollenwerk</author>
    <author>Peter Friedrich</author>
    <author>Vadim Burwitz</author>
    <author>Gisela Hartner</author>
    <author>Miranda Bradshaw</author>
    <author>Yingyu Liao</author>
    <author>Carlo Pelliciari</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>iridium</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>mirror</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>coating</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>reflectivity</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>swd</type>
      <value>Röntgenastronomie</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>swd</type>
      <value>Röntgenteleskop</value>
    </subject>
    <collection role="forschungsschwerpunkte" number="">Innovative Material Processing</collection>
    <collection role="forschungsschwerpunkte" number="">Material Testing &amp; Sensor Technology</collection>
  </doc>
</export-example>
