<?xml version="1.0" encoding="utf-8"?>
<export-example>
  <doc>
    <id>1885</id>
    <completedYear>2021</completedYear>
    <publishedYear/>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>118524P-1</pageFirst>
    <pageLast>118524P-13</pageLast>
    <pageNumber>13</pageNumber>
    <edition/>
    <issue>11852</issue>
    <volume>2021</volume>
    <type>conferenceobject</type>
    <publisherName>SPIE</publisherName>
    <publisherPlace/>
    <creatingCorporation>Osservatorio Astronomico di Brera</creatingCorporation>
    <contributingCorporation>TH Aschaffenburg</contributingCorporation>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2021-06-17</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Development of low-density coatings for soft x-ray reflectivity enhancement for ATHENA and other missions</title>
    <abstract language="eng">Metallic coatings made of precious metals (e.g. Ir, Pt or Au) with high atomic number Z have been traditionally employed at grazing incidence for X-rays reflection and focalization. These materials offer a range of reflection extended to higher energies, but also present a series of absorption edges, which limit the reflectivity in the 2-4 keV band and below. Therefore the search for alternative coatings, able to improve the reflection in the soft energy range, is particularly relevant for the development of future telescopes, like ATHENA (ESA), Lynx (NASA) and eXTP (CAS). Low-Z overcoatings (e.g. carbon or B4C), applied on top of the high-Z metallic layer, can enhance the reflectivity in the softer band (mainly below 2 keV), but conventional deposition methods for these materials are not easily compatible with some of the mainstream technologies for mirror fabrication (notably, the silicon pore optics that will be used for the ATHENA X-ray mission which is being implemented by ESA). In this work we discuss novel solutions (carbon-like overcoatings realized by dip coating or vapor phase deposition), which can be particularly convenient for the application to ATHENA and to future telescopes.</abstract>
    <parentTitle language="eng">Proceedings of SPIE</parentTitle>
    <identifier type="doi">https://doi.org/10.1117/12.2599803</identifier>
    <enrichment key="copyright">1</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <licence>Keine Lizenz - es gilt das deutsche Urheberrecht</licence>
    <author>Vincenzo Cotroneo</author>
    <author>Ricardo Bruni</author>
    <author>Thorsten Döhring</author>
    <author>Desiree Ferreira</author>
    <author>Eugenio Gibertini</author>
    <author>Peter Henriksen</author>
    <author>Luca Magagnin</author>
    <author>Sonny Massahi</author>
    <author>Giovanni Pareschi</author>
    <author>Suzanne Romaine</author>
    <author>Leandra Sethares</author>
    <author>Giorgia Sironi</author>
    <author>Daniele Spiga</author>
    <author>Gianpiero Tagliaferri</author>
    <author>Giuseppe Valsecchi</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>optics</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>ATHENA</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>iridium</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>reflectivity</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>swd</type>
      <value>Röntgenteleskop</value>
    </subject>
    <collection role="forschungsschwerpunkte" number="">Innovative Material Processing</collection>
    <collection role="forschungsschwerpunkte" number="">Material Testing &amp; Sensor Technology</collection>
  </doc>
  <doc>
    <id>2047</id>
    <completedYear>2022</completedYear>
    <publishedYear/>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>121814S-1</pageFirst>
    <pageLast>121814s-7</pageLast>
    <pageNumber>7</pageNumber>
    <edition/>
    <issue>12181</issue>
    <volume>2022</volume>
    <type>conferenceobject</type>
    <publisherName>SPIE</publisherName>
    <publisherPlace/>
    <creatingCorporation>Osservatorio Astronomico di Brera</creatingCorporation>
    <contributingCorporation>TH Aschaffenburg</contributingCorporation>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2022-09-06</completedDate>
    <publishedDate>2022-08-31</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Upgrade of a laboratory X-ray diffractometer to extend its operating range towards soft energies</title>
    <abstract language="eng">The optical properties of X-ray mirror samples are commonly measured using diffractometers based on laboratory sources; like the Bede D1 diffractometer operating at INAF-OAB. This instrument can generate a collimated X-ray beam up to 60 keV, even though the most interesting energy region for x-ray astronomy applications is usually below 10 keV. In the softest part of this range (below 6 keV), high X-ray absorption in air hinders a full and precise characterization of optical components. In this work, we present an upgrade of the Bede D1 diffractometer that extends the operative range of the&#13;
instrument below 6 keV; this is done by maximizing the flux at lowest energies and by reducing absorption by means of a helium-rich atmosphere.&#13;
The upgraded instrument will be used for the tests of X-ray mirrors with innovative soft X-ray coatings, with potential application to the next generation X-ray telescopes (such as ATHENA and eXTP).</abstract>
    <parentTitle language="eng">Proceedings of SPIE</parentTitle>
    <identifier type="issn">0277-786X</identifier>
    <identifier type="url">https://www.spiedigitallibrary.org/conference-proceedings-of-spie/12181/121814S/Upgrade-of-a-laboratory-x-ray-diffractometer-to-extend-its/10.1117/12.2629940.short</identifier>
    <identifier type="doi">doi: 10.1117/12.2629940</identifier>
    <enrichment key="copyright">1</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <licence>Keine Lizenz - es gilt das deutsche Urheberrecht</licence>
    <author>Giacomo Rivolta</author>
    <author>Stefano Basso</author>
    <author>Marta Maria Civitani</author>
    <author>Vincenzo Cotroneo</author>
    <author>Thorsten Döhring</author>
    <author>Willy-Leopold Michler</author>
    <author>Giovanni Pareschi</author>
    <author>Daniele Spiga</author>
    <author>Manfred Stollenwerk</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>mirror</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>reflectivity</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>refractometer</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>ATHENA</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>swd</type>
      <value>Röntgenspiegel</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>swd</type>
      <value>Diffraktometer</value>
    </subject>
    <collection role="institutes" number="">Internationales Technisches Vertriebsmanagement (Bachelor)</collection>
    <collection role="forschungsschwerpunkte" number="">Material Testing &amp; Sensor Technology</collection>
  </doc>
</export-example>
