<?xml version="1.0" encoding="utf-8"?>
<export-example>
  <doc>
    <id>1865</id>
    <completedYear>2021</completedYear>
    <publishedYear/>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1177607-1</pageFirst>
    <pageLast>11776076</pageLast>
    <pageNumber>8</pageNumber>
    <edition/>
    <issue>11776</issue>
    <volume>2021</volume>
    <type>conferenceobject</type>
    <publisherName>SPIE</publisherName>
    <publisherPlace/>
    <creatingCorporation>TH Aschaffenburg</creatingCorporation>
    <contributingCorporation>Physikalisch-Technische Bundesanstalt</contributingCorporation>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2021-05-24</completedDate>
    <publishedDate>2021-04-18</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Characterisation of X-ray mirrors based on  chromium-iridium tri-layer coatings</title>
    <abstract language="eng">Iridium-based layer systems are highly effective mirror coatings for space-born X-ray telescopes. During the recent years, Aschaffenburg University of Applied Sciences and its partners developed stress compensated chromium-iridium coatings for such astronomical applications, using chromium as an adhesive layer between iridium reflective layer and mirror substrate. However, there was room for improvement: To overcome the disturbing reflectivity reduction of the iridium absorption edge around 2 keV photon energy, thin overcoat layers of chromium are applied in addition now. This layer system has been analyzed by atomic force microscopy and transmission electron microscopy images. Furthermore, the reflectivity of such innovative X-ray mirrors based on chromium-iridium tri-layer coatings was recently measured at PTB's four-crystal monochromator beamline at the synchrotron radiation facility BESSY II.  The experimental results, obtained for photon energies between 1.9 keV and 11 keV at two grazing incidence angles (0.6 degree and 0.9 degree) and their comparison with corresponding simulations are presented in this contribution. When compared to simulations of pure iridium coatings, a significantly higher reflectivity was achieved especially in the soft X-ray regime between 2 keV and 4 keV. Such chromium-iridium tri-layer coatings have high potential to increase the effective area for X-ray telescopes in Lobster Eye Design, for Wolter-I type X-ray optics, and for silicon pore optics as considered for the ATHENA telescope of the European Space Agency.</abstract>
    <parentTitle language="eng">Proceedings of SPIE</parentTitle>
    <identifier type="doi">https://doi.org/10.1117/12.2592551</identifier>
    <enrichment key="copyright">1</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <licence>Keine Lizenz - es gilt das deutsche Urheberrecht</licence>
    <author>Thorsten Döhring</author>
    <author>Manfred Stollenwerk</author>
    <author>Johannes Stadtmüller</author>
    <author>Sebastian Zeising</author>
    <author>Dennis Flachs</author>
    <author>Veronika Stehlikova</author>
    <author>Vadim Burwitz</author>
    <author>Michael K. Krumrey</author>
    <author>Vincenzo Cotroneo</author>
    <author>Mariana Klementova</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>iridium</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>mirror</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>coating</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>telescope</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>swd</type>
      <value>Röntgenspiegel</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>swd</type>
      <value>Röntgenteleskop</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>swd</type>
      <value>Iridium</value>
    </subject>
    <collection role="forschungsschwerpunkte" number="">Innovative Material Processing</collection>
    <collection role="forschungsschwerpunkte" number="">Material Testing &amp; Sensor Technology</collection>
  </doc>
  <doc>
    <id>1006</id>
    <completedYear>2017</completedYear>
    <publishedYear/>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>101</pageFirst>
    <pageLast>107</pageLast>
    <pageNumber/>
    <edition/>
    <issue>343</issue>
    <volume>2017</volume>
    <type>article</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2018-09-01</completedDate>
    <publishedDate>2017-10-25</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Influence of sputtering pressure on the nanostructure and the X-ray reflectivity of iridium coatings</title>
    <abstract language="eng">Reflective mirror coatings made of iridium are used in X-ray telescopes of the Chandra X-ray Observatory (CXO) launched in 1999 by the National Aeronautics and Space Administration (NASA) to investigate astronomical sources at photon energies below 10. keV. These coatings were produced in a DC magnetron sputtering process and have so far proven their suitability for space-based applications. We are considering in the present paper the processing of thin iridium films for lightweight telescopes using the radio frequency magnetron sputtering technique with an oblique angle deposition. The coating development presented here is focused on the influence of total sputtering pressure on film properties as well as on its impact on the mirror's performance. Characterisation methods such as X-ray diffractometry, X-ray reflectometry, atomic force microscopy and transmission electron microscopy have been used. Correlations between morphology, density, surface micro-roughness, crystal structure of the iridium layer and the expected reflectivity of the X-ray mirror are described and discussed.</abstract>
    <parentTitle language="eng">Surface and Coatings Technology</parentTitle>
    <identifier type="url">https://doi.org/10.1016/j.surfcoat.2017.10.062</identifier>
    <identifier type="issn">0257-8972</identifier>
    <enrichment key="copyright">1</enrichment>
    <licence>Keine Lizenz - es gilt das deutsche Urheberrecht</licence>
    <author>Anne-Catherine Probst</author>
    <author>Manfred Stollenwerk</author>
    <author>Florian Emmerich</author>
    <author>Andre Büttner</author>
    <author>Sebastian Zeising</author>
    <author>Johannes Stadtmüller</author>
    <author>Franziska Riethmüller</author>
    <author>Veronika Stehlikova</author>
    <author>Wen Mingwu</author>
    <author>Laura Proserpio</author>
    <author>Christine Damm</author>
    <author>Bernd Rellinghaus</author>
    <author>Thorsten Döhring</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Iridium</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>sputtering</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>microstructure</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>coating</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>swd</type>
      <value>Iridium</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>swd</type>
      <value>Röntgenteleskop</value>
    </subject>
    <collection role="forschungsschwerpunkte" number="">Clean Tech</collection>
    <collection role="forschungsschwerpunkte" number="">Innovative Material Processing</collection>
    <collection role="forschungsschwerpunkte" number="">Material Testing &amp; Sensor Technology</collection>
  </doc>
</export-example>
