@article{WolterSchwedlerGallmannetal.1991, author = {Wolter, Karl and Schwedler, Ralf and Gallmann, B. and Jaekel, Christian and Stollenwerk, Manfred and Camassel, Jean and Laurenti, Jean Pierre}, title = {Optical characterization of strained InGaAs/InP quantum well structures}, series = {Microelectronic Engineering}, volume = {15}, journal = {Microelectronic Engineering}, number = {1-4}, pages = {593 -- 596}, year = {1991}, abstract = {The effects of strain on the optical properties ofmultiple-quantum well structures grown by low pressure metal organic vapor phase epitaxy have been investigated by photoluminescence spectroscopy. The investigated composition range is varied between 0.17 ≤ xGa ≤ 1.00. Sputtered neutrals mass spectroscopy has been used to calibrate the growth interpolated nominal compositions. Distinct peaks from monolayer variations of well thickness are observed from all samples. The analysis of the PL-spectra leads to the assumption of an intermediate layer of InAs0.65P0.35 at the InP to In1-ϰGaχAs(lower) interface.}, subject = {Indiumarsenid}, language = {en} }