@phdthesis{Rauer2018, author = {Rauer, Miriam}, title = {Der Einfluss von Poren auf die Zuverl{\"a}ssigkeit der L{\"o}tverbindungen von Hochleistungs-Leuchtdioden}, isbn = {978-3-96147-158-4}, url = {http://nbn-resolving.de/urn:nbn:de:bvb:29-opus4-104749}, school = {Technische Hochschule Aschaffenburg}, year = {2018}, subject = {L{\"o}tverbindung}, language = {de} } @inproceedings{RauerXuReinhardtetal.2016, author = {Rauer, Miriam and Xu, Ping and Reinhardt, Andreas and Kaloudis, Michael and Franke, J{\"o}rg}, title = {Einfluss von Poren in L{\"o}tverbindungen bei LED-Anwendungen}, series = {Elektronische Baugruppen und Leiterplatten - EBL 2016}, booktitle = {Elektronische Baugruppen und Leiterplatten - EBL 2016}, publisher = {VDE Verlag}, address = {Berlin}, isbn = {978-3-8007-4147-2}, pages = {135 -- 139}, year = {2016}, subject = {L{\"o}tverbindung}, language = {de} } @inproceedings{RauerSchreckHaerteretal.2015, author = {Rauer, Miriam and Schreck, Timo and H{\"a}rter, Stefan and Kaloudis, Michael}, title = {The Effect of Thermal Stress on the Reliability of low Ag Solder Joints in High Power LEDs}, series = {20th European Microelectronics and Packaging Conference (EMPC) \& Exhibition, 14.-16.09.2015}, booktitle = {20th European Microelectronics and Packaging Conference (EMPC) \& Exhibition, 14.-16.09.2015}, pages = {1 -- 6}, year = {2015}, subject = {Lumineszenzdiode}, language = {en} } @article{AmrheinRauer2014, author = {Amrhein, Sebastian and Rauer, Miriam}, title = {Characterization of Computer Tomography Scanners Using the Probability of Detection Method}, series = {Journal of Nondestructive Evaluation}, volume = {33}, journal = {Journal of Nondestructive Evaluation}, number = {4}, editor = {Meyendorf, Norbert}, pages = {643 -- 650}, year = {2014}, abstract = {Industrial computed tomography (CT) is increasingly gaining in importance as a nondestructive testing method (NDT). As with any other NDT method, the requirement for its performance and detection capabilities to be assessed increases as it is used more frequently. Simultaneously, it is becoming important for users to be able to quantitatively measure and compare the suitability of systems available on the market for their own applications. This probability of detection (POD) method makes it possible to create application-specific POD curves for CT systems using a specially-developed POD test specimen. Within the context of this study, a micro-CT scanner with an accelerating voltage of 225 kV and specimens of stainless steel with thicknesses of 1,050 and 2,050 μm was assessed as an example. When developing this method, special value was placed on reproducibility and universal applicability.}, subject = {Computertomographie}, language = {de} } @article{RauerVolkertHaerteretal.2014, author = {Rauer, Miriam and Volkert, Antje and H{\"a}rter, Stefan and Schreck, Timo and Kaloudis, Michael}, title = {Computed-Tomography-Based Analysis of Voids in SnBi57Ag1 Solder Joints and Their Influence on the Reliability}, series = {Journal of Failure Analysis and Prevention}, volume = {14}, journal = {Journal of Failure Analysis and Prevention}, number = {3}, editor = {Stevenson, Michael}, pages = {272 -- 281}, year = {2014}, subject = {Computertomographie}, language = {de} } @article{RauerKaloudis2014, author = {Rauer, Miriam and Kaloudis, Michael}, title = {Ausfallanalyse an einem Lithium-Ionen Akkumulator}, series = {Maschinenmarkt}, volume = {2014}, journal = {Maschinenmarkt}, number = {2}, pages = {45 -- 46}, year = {2014}, subject = {Lithium-Ionen-Akkumulator}, language = {de} } @article{RauerKaloudis2014, author = {Rauer, Miriam and Kaloudis, Michael}, title = {Computertomographie erweitert das Blickfeld}, series = {Mikroproduktion}, volume = {2014}, journal = {Mikroproduktion}, number = {1}, pages = {50 -- 51}, year = {2014}, subject = {Computertomographie}, language = {de} } @article{DresslerRauerKaloudisetal.2014, author = {Dressler, Katharina and Rauer, Miriam and Kaloudis, Michael and Dauwe, Stefan and Herguth, Axel and Hahn, Giso}, title = {Nondestructive Characterization of Voids in Rear Local Contacts of PERC-Type Solar Cells}, series = {IEEE Journal of Photovoltaics}, volume = {2015}, journal = {IEEE Journal of Photovoltaics}, number = {1}, doi = {10.1109/JPHOTOV.2014.2359745}, pages = {70 -- 76}, year = {2014}, abstract = {In this paper, we present two nondestructive characterization methods for the detection of voids in rear local contacts of passivated emitter and rear-type solar cells, namely scanning acoustic microscopy and computer tomography. We compare both methods and include a comparison with electroluminescence measurements. It is shown in this paper that voids can easily be detected with both measurement types without any sample preparation. We found a good match of scanning acoustic microscopy (SAM) and computer tomography (CT), which is presented for this purpose for the first time. The investigation was carried out for different aluminum pastes.}, subject = {Solarzelle}, language = {de} } @article{RauerSchreckKaloudis2013, author = {Rauer, Miriam and Schreck, Timo and Kaloudis, Michael}, title = {X-Ray Computed Tomography as Supporting Technology in the Failure Analysis of Press-In Connections for Electronic Assemblies}, series = {Practical Metallography}, volume = {50(2013)}, journal = {Practical Metallography}, number = {3}, pages = {205 -- 221}, year = {2013}, subject = {Fehleranalyse}, language = {en} } @article{RauerKaloudis2013, author = {Rauer, Miriam and Kaloudis, Michael}, title = {Hinter der Fassade - Ausfallanalyse an einem Lithium-Ionen Akkumulator mittels CT}, series = {QZ Qualit{\"a}t und Zuverl{\"a}ssigkeit}, volume = {2013}, journal = {QZ Qualit{\"a}t und Zuverl{\"a}ssigkeit}, number = {1}, pages = {40 -- 41}, year = {2013}, subject = {Lithium-Ionen-Akkumulator}, language = {de} }