@article{ProbstBegouDoehringetal.2018, author = {Probst, Anne-Catherine and Begou, Thomas and D{\"o}hring, Thorsten and Zeising, Sebastian and Stollenwerk, Manfred and Stadtm{\"u}ller, Johannes and Emmerich, Florian and Lumeau, Julien}, title = {Coating stress analysis and compensation for iridium-based x-ray mirrors}, series = {Applied Optics}, volume = {2018}, journal = {Applied Optics}, number = {57 (29)}, editor = {Publishing OSA,}, pages = {8775 -- 8779}, year = {2018}, abstract = {Iridium-based coatings for mirrors of x-ray telescopes are studied. In particular, stress-induced deformation is characterized and shown to be compressive and equal to -1786  MPa. Two methods for stress compensation are then studied. One relies on the deposition of silica on the back surface of the substrate and a second one relies on the deposition of a chromium sublayer. Advantages and drawbacks of each of these techniques are presented.}, subject = {R{\"o}ntgenteleskop}, language = {en} } @article{BuettnerProbstEmmerichetal.2018, author = {B{\"u}ttner, Andre and Probst, Anne-Catherine and Emmerich, Florian and Damm, Christine and Rellinghaus, Bernd and D{\"o}hring, Thorsten and Stollenwerk, Manfred}, title = {Influence of Sputtering Pressure on the Microstructure and Layer Properties of Iridium Thin Films}, series = {Thin Solid Films}, volume = {2018}, journal = {Thin Solid Films}, number = {662}, issn = {0040-6090}, pages = {41 -- 46}, year = {2018}, abstract = {Iridium layers with low stress, high density, and low surface roughness find widespread use in different high-technology applications. This paper presents a study of the influence of the sputtering pressure on the properties of iridium thin films and of its effect on the substrate surface microstructure. We analysed the dependence of the microstructure, crystalline structure, electrical resistivity, and deposition rate on the sputtering pressure and surface defects of the substrate. For the latter, plasma etching of the substrate was performed for different processing times and its effect on the surface roughness of substrates and, subsequently, on the grown iridium films, was examined. The sputtering pressure and the substrate plasma etching time both had a strong influence on the microstructure and surface roughness. These microstructural changes are in good agreement with the tendency described in the Thornton Structure-Zone Model for different sputtering pressures and the microstructure phase map of Alvarez. The electrical resistivity, deposition rate, and crystalline structure were highly dependent on the sputtering pressure.}, subject = {Iridium}, language = {en} } @article{StehlikovaProbstNentvichetal.2018, author = {Stehlikova, Veronika and Probst, Anne-Catherine and Nentvich, Ondrej and Urban, Martin and Sieger, Ladislav and D{\"o}hring, Thorsten and Hudec, Ren{\´e}}, title = {Study of multiple layers coatings for X-ray mirrors}, series = {Contributions of the Astronomical Observatory Skalnat{\´e} Pleso}, volume = {2018}, journal = {Contributions of the Astronomical Observatory Skalnat{\´e} Pleso}, number = {48}, editor = {Skopal, August{\´i}n}, pages = {488 -- 497}, year = {2018}, abstract = {This paper focuses on a theoretical background that motivated the experimental campaign of multiple layer coatings of X-ray mirrors, and the first results of the testing of the prepared samples. Simulations of the use of different overcoats were performed in order to improve the reflectivity of thin iridium coatings designed for X-ray optics effective in the energy up to 10 keV. Samples based on these simulations were prepared and are being tested for the properties that influence the X-ray optical performance, such as layer homogeneity, density and surface micro-roughness. Further the topic of the coating stress was addressed, as it is an issue in case of thin, lightweight X-ray mirrors and affects the time stability of layers. The discussion and preliminary results conclude our contribution.}, subject = {R{\"o}ntgenspiegel}, language = {en} } @article{DoehringHudec2018, author = {D{\"o}hring, Thorsten and Hudec, Rene}, title = {JEUMICO and TRILAMICO: Dimensions of successful Bavarian-Czech cooperation}, series = {Contributions of the Astronomical Observatory Skalnat{\´e} Pleso}, volume = {2018}, journal = {Contributions of the Astronomical Observatory Skalnat{\´e} Pleso}, number = {Vol. 48 / 3}, editor = {Skopal, August{\´i}n}, pages = {430 -- 436}, year = {2018}, abstract = {In December 2017 the two projects JEUMICO (an acronym for Joint European Mirror Cooperation) and TRILAMICO (standing for Trilateral Mirror Collaboration) are ending. Different aspects of this Bavarian-Czech collaboration between Aschaffenburg University and the Czech Technical University in Prague are discussed. The multiple dimensions of this cooperation are scientific achievements, public relation measures, internationalization of education, financial aspects, inter-cultural communication, and also the actual political situation within Europe.}, subject = {R{\"o}ntgenspiegel}, language = {en} } @inproceedings{DoehringProbstZeising2018, author = {D{\"o}hring, Thorsten and Probst, Anne-Catherine and Zeising, Sebastian}, title = {Analyse der Schichtspannungen von R{\"o}ntgenspiegeln mit einem Weißlichtinterferometer}, series = {DGaO-Proceedings}, volume = {2018}, booktitle = {DGaO-Proceedings}, number = {2018}, publisher = {Deutsche Gesellschaft f{\"u}r angewandte Optik e.V.}, address = {Erlangen}, organization = {Hochschule Aschaffenburg}, issn = {1614-8436}, pages = {P10-1 -- P10-2}, year = {2018}, abstract = {An der Hochschule Aschaffenburg werden iridiumbasierte Schichtsysteme f{\"u}r r{\"o}ntgenastronomische Anwendungen hergestellt. Unter Nutzung eines Weißlichtinterferometers wurde hierf{\"u}r ein Verfahren zur Vermessung der inh{\"a}renten Schichtspannungen entwickelt. Erste vielversprechende Ergebnisse von spannungsarmen R{\"o}ntgenreflexionsbeschichtungen werden vorgestellt.}, subject = {R{\"o}ntgenspiegel}, language = {de} }