@inproceedings{RauerSchreckHaerteretal.2015, author = {Rauer, Miriam and Schreck, Timo and H{\"a}rter, Stefan and Kaloudis, Michael}, title = {The Effect of Thermal Stress on the Reliability of low Ag Solder Joints in High Power LEDs}, series = {20th European Microelectronics and Packaging Conference (EMPC) \& Exhibition, 14.-16.09.2015}, booktitle = {20th European Microelectronics and Packaging Conference (EMPC) \& Exhibition, 14.-16.09.2015}, pages = {1 -- 6}, year = {2015}, subject = {Lumineszenzdiode}, language = {en} } @article{AmrheinKehrerSchrecketal.2011, author = {Amrhein, Frank and Kehrer, Martin and Schreck, Timo and Bochtler, Ulrich and Hellmann, Ralf and Kaloudis, Michael}, title = {UV-LED-Bestrahlung von Vergussmaterial: Schnelle Aush{\"a}rtung auch im Schatten}, series = {adh{\"a}sion KLEBEN \& DICHTEN}, journal = {adh{\"a}sion KLEBEN \& DICHTEN}, number = {5}, pages = {38 -- 41}, year = {2011}, subject = {Lumineszenzdiode}, language = {de} } @article{AmrheinBochtlerHellmannetal.2010, author = {Amrhein, Frank and Bochtler, Ulrich and Hellmann, Ralf and Kaloudis, Michael and Kaloumenos, Mareiki}, title = {Vergleich der thermischen Eigenschaften unterschiedlicher insulated metal substrat-Leiterplatten}, series = {PLUS, Leiterplattentechnik}, journal = {PLUS, Leiterplattentechnik}, number = {8}, publisher = {Hanser Verlag}, address = {M{\"u}nchen}, pages = {1758}, year = {2010}, subject = {Gedruckte Schaltung}, language = {de} } @article{RauerSchreckKaloudis2013, author = {Rauer, Miriam and Schreck, Timo and Kaloudis, Michael}, title = {X-Ray Computed Tomography as Supporting Technology in the Failure Analysis of Press-In Connections for Electronic Assemblies}, series = {Practical Metallography}, volume = {50(2013)}, journal = {Practical Metallography}, number = {3}, pages = {205 -- 221}, year = {2013}, subject = {Fehleranalyse}, language = {en} }