Comparison of Five Methods in Determination of Parasitic Resistance in Ion Implamted GaAs FETs
Author: | Peter Baureis, T. Zimmer |
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Parent Title (English): | Failure Physics and Analysis |
Subtitle (English): | Proceedings 2nd European Symposium On Reliability of Electron Devices (ESREF 1991) |
Document Type: | Conference Proceeding |
Language: | English |
Year of publication: | 1991 |
Release Date: | 2017/08/17 |
First Page: | 467 |
Last Page: | 474 |
Institutes and faculty: | Fakultäten / Fakultät für angewandte Natur- und Geisteswissenschaften |