TY - CHAP A1 - Hartmann, Jürgen A1 - Manara, Jochen A1 - Zipf, Matthias A1 - Stark, Thomas A1 - Arduini, Mariacarla A1 - Ebert, Hans-Peter A1 - Tutschke, Andreas A1 - Hallam, Andrew A1 - Hanspal, Jagdevinder A1 - Langley, Mark A1 - Hodge, D. T1 - Development of Long Wavelength Infrared Radiation Thermometry for Measurements in Gas Turbines BT - Key Note Lecture MSE 2016 Y1 - 2016 CY - Darmstadt ER - TY - CHAP A1 - Hartmann, Jürgen A1 - Knopp, Kevin A1 - Lenski, Philipp A1 - Zänglein, Marc A1 - Manara, Jochen A1 - Stark, Thomas A1 - Zipf, Matthias A1 - Arduini, Mariacarla A1 - Schreiber, Ekkehard A1 - Krüger, U. A1 - Schmidt, Franz A1 - Brunner, Martin T1 - Sensor systems for additive manufacturing Y1 - 2018 PB - Key Note Lecture MSE 2018 CY - Darmstadt ER - TY - CHAP A1 - Hartmann, Jürgen A1 - Manara, Jochen A1 - Zipf, Mathias A1 - Stark, Thomas A1 - Knopp, Kevin A1 - Zänglein, Marc A1 - Lenski, Philipp A1 - Schreiber, Ekkehard A1 - Schmidt, Franz A1 - Brunner, Martin A1 - Müller, Michael T1 - Thermophysical property measurements at high-temperatures for power engineering and additive manufacturing processes BT - QIRT 2018, 25 - 29 June 2018, Berlin, Germany N2 - To address the needs for increasing efficiency in power conversion, stratified structures like thermal barrier coatings, are used to increase operation temperature. Also advanced material processing like 3D laser printing of metals and ceramics are based on a layer-to-layer process at high temperatures, resulting in non-homogeneous components. Both systems require more and more detailed investigation methods to characterise the material properties of the resulting structures and to optimize the relevant processes. To address the required needs in advanced material characterisation recently an attempt was started to develop a unique measurement set-up for advanced material characterisation. This method is based on the well know laser flash principle, which was improved by adding supplementary heating sources and additional detection channels. Combining different heating mechanism and heating times with the two-dimensional measuring of the thermal flow across the sample enables the determination of different opto-thermal parameters and other material properties, e.g. mechanical contact, electrical conductivity or optical data, which also depend on or affect the flow of heat. In this paper we describe the implementation of the different optical methods to measure the thermal heat flow by point-like and two-dimensional temperature measurement and present first results on several samples. KW - thermophysical property measurement KW - additive manufacturing process Y1 - 2018 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:863-opus-17678 SN - 978-3-940283-94-8 CY - Berlin ER - TY - JOUR A1 - Jürgen, Hartmann A1 - Arduini, Mariacarla A1 - Manara, Jochen A1 - Stark, Thomas A1 - Ebert, Hans-Peter T1 - Development and Evaluation of an Improved Apparatus for Measuring the Emissivity at High Temperatures JF - Sensors N2 - An improved apparatus for measuring the spectral directional emissivity in the wavelength range between 1 µm and 20 µm at temperatures up to 2400 K is presented in this paper. As a heating unit an inductor is used to warm up the specimen, as well as the blackbody reference to the specified temperatures. The heating unit is placed in a double-walled vacuum vessel. A defined temperature, as well as a homogenous temperature distribution of the whole surrounding is ensured by a heat transfer fluid flowing through the gap of the double-walled vessel. Additionally, the surrounding is coated with a high-emitting paint and serves as blackbody-like surrounding to ensure defined boundary conditions. For measuring the spectral directional emissivity at different emission angles, a movable mirror is installed in front of the specimen, which can be adjusted by a rotatable arrangement guiding the emitted radiation into the attached FTIR-spectrometer. The setup of the emissivity measurement apparatus (EMMA) and the measurement procedure are introduced, and the derived measurement results are presented. For evaluating the apparatus, measurements were performed on different materials. The determined emissivities agree well with values published in literature within the derived relative uncertainties below 4% for most wavelengths. KW - emissivity KW - reflectivity KW - infrared radiation KW - high temperature KW - Temperatur KW - Emissivität Y1 - 2021 UR - https://www.mdpi.com/1424-8220/21/18/6252 U6 - https://doi.org/10.3390/s21186252 SN - 1424-8220 VL - 21 IS - 18 ER -