TY - JOUR A1 - Schmitt, Robert A1 - Hafner, Philip A1 - Engelmann, Bastian T1 - Strategies for the non-destructive characterization of thin layers with Scanning Acoustic Microscopy JF - tm - Technisches Messen Y1 - 2007 VL - 74 IS - 6 SP - 365 EP - 373 ER -