TY - JOUR A1 - Engelmann, Bastian T1 - Towards Material-Batch-Aware Tool Condition Monitoring JF - Journal of Manufacturing and Materials Processing N2 - In subtractive manufacturing, process monitoring systems are used to observe the manufacturing process, to predict maintenance actions and to suggest process optimizations. One challenge, however, is that the observable signals are influenced not only by the degradation of the cutting tool, but also by deviations in machinability among material batches. Thus it is necessary to first predict the respective material batch before making maintenance decisions. In this study, an approach is shown for batch-aware tool condition monitoring using feature extraction and unsupervised learning to analyze high-frequency control data in order to detect clusters of materials with different machinability, and subsequently optimize the respective manufacturing process. This approach is validated using cutting experiments and implemented as an edge framework. KW - manufacturing KW - material Y1 - 2021 UR - https://doi.org/10.3390/jmmp5040103 SN - 2504-4494 VL - 5 IS - 4 ER - TY - JOUR A1 - Pfeifer, Tilo A1 - Engelmann, Bastian T1 - Strategies for the surface measurement with a confocal laserscanning-microscope JF - Tagungsband zur Konferenz IX. Internationales Oberflächenkolloquium in Chemnitz Y1 - 2004 SP - 249 EP - 257 ER - TY - JOUR A1 - Schmitt, Robert A1 - Engelmann, Bastian T1 - Approaches for the control of microsystem assembly by image processing JF - Conference Proceedings of Micro System 2005 in Munich Y1 - 2005 ER - TY - JOUR A1 - Driessen, Sascha A1 - Dietrich, B. A1 - Engelmann, Bastian T1 - Mit Planung ans Ziel JF - Qualität und Zuverlässigkeit Y1 - 2004 IS - 9 SP - 19 EP - 20 ER - TY - JOUR A1 - Schmitt, Robert A1 - Dietrich, Björn A1 - Hafner, Philip A1 - Engelmann, Bastian T1 - Messstrategien für die zerstörungsfreie Schichtmessung mittels Ultraschallmikroskopie Strategies for the Non-Destructive Characterization of Thin Layers with Scanning Acoustic Microscopy JF - tm - Technisches Messen Y1 - 2008 VL - 75 IS - 11 SP - 577 EP - 585 ER - TY - JOUR A1 - Schmitt, Robert A1 - Hafner, Philip A1 - Engelmann, Bastian T1 - Strategies for the non-destructive characterization of thin layers with Scanning Acoustic Microscopy JF - tm - Technisches Messen Y1 - 2007 VL - 74 IS - 6 SP - 365 EP - 373 ER - TY - JOUR A1 - Pfeifer, Tilo A1 - Dussler, G A1 - Engelmann, Bastian T1 - Visualisierungsmethoden für Mikrostrukturen mit dem konfokalen Laser-Scanning-Mikroskop JF - VDI-Berichte Y1 - 2003 SP - 175 EP - 185 ER - TY - JOUR A1 - Schmitt, Robert A1 - Engelmann, Bastian T1 - Keine Ermessensfrage!: Warum fähige Messgeräte wichtige Voraussetzung für Oberflächenoptimierungen sind JF - Metalloberfläche Y1 - 2005 VL - 59 IS - 9 SP - 39 EP - 42 ER - TY - BOOK A1 - Engelmann, Bastian T1 - Entwicklung einer Systematik zur Modellierung oberflächenabhängiger Funktionseigenschaften KW - Produktionstechnik Y1 - 2007 SN - 978-3-8322-6558-8 PB - Shaker ER - TY - JOUR A1 - Schmitt, Robert A1 - Driessen, Sascha A1 - Engelmann, Bastian T1 - Controlling the assembly of micro systems by image processing JF - Microsystem technologies Y1 - 2006 VL - 12 SP - 640 EP - 645 ER -