@article{Engelmann, author = {Engelmann, Bastian}, title = {Towards Material-Batch-Aware Tool Condition Monitoring}, series = {Journal of Manufacturing and Materials Processing}, volume = {5}, journal = {Journal of Manufacturing and Materials Processing}, number = {4}, issn = {2504-4494}, abstract = {In subtractive manufacturing, process monitoring systems are used to observe the manufacturing process, to predict maintenance actions and to suggest process optimizations. One challenge, however, is that the observable signals are influenced not only by the degradation of the cutting tool, but also by deviations in machinability among material batches. Thus it is necessary to first predict the respective material batch before making maintenance decisions. In this study, an approach is shown for batch-aware tool condition monitoring using feature extraction and unsupervised learning to analyze high-frequency control data in order to detect clusters of materials with different machinability, and subsequently optimize the respective manufacturing process. This approach is validated using cutting experiments and implemented as an edge framework.}, language = {en} } @article{PfeiferEngelmann, author = {Pfeifer, Tilo and Engelmann, Bastian}, title = {Strategies for the surface measurement with a confocal laserscanning-microscope}, series = {Tagungsband zur Konferenz IX. Internationales Oberfl{\"a}chenkolloquium in Chemnitz}, journal = {Tagungsband zur Konferenz IX. Internationales Oberfl{\"a}chenkolloquium in Chemnitz}, pages = {249 -- 257}, language = {en} } @article{SchmittEngelmann, author = {Schmitt, Robert and Engelmann, Bastian}, title = {Approaches for the control of microsystem assembly by image processing}, series = {Conference Proceedings of Micro System 2005 in Munich}, journal = {Conference Proceedings of Micro System 2005 in Munich}, language = {en} } @article{DriessenDietrichEngelmann, author = {Driessen, Sascha and Dietrich, B. and Engelmann, Bastian}, title = {Mit Planung ans Ziel}, series = {Qualit{\"a}t und Zuverl{\"a}ssigkeit}, journal = {Qualit{\"a}t und Zuverl{\"a}ssigkeit}, number = {9}, pages = {19 -- 20}, language = {de} } @article{SchmittDietrichHafneretal., author = {Schmitt, Robert and Dietrich, Bj{\"o}rn and Hafner, Philip and Engelmann, Bastian}, title = {Messstrategien f{\"u}r die zerst{\"o}rungsfreie Schichtmessung mittels Ultraschallmikroskopie Strategies for the Non-Destructive Characterization of Thin Layers with Scanning Acoustic Microscopy}, series = {tm - Technisches Messen}, volume = {75}, journal = {tm - Technisches Messen}, number = {11}, pages = {577 -- 585}, language = {en} } @article{SchmittHafnerEngelmann, author = {Schmitt, Robert and Hafner, Philip and Engelmann, Bastian}, title = {Strategies for the non-destructive characterization of thin layers with Scanning Acoustic Microscopy}, series = {tm - Technisches Messen}, volume = {74}, journal = {tm - Technisches Messen}, number = {6}, pages = {365 -- 373}, language = {en} } @article{PfeiferDusslerEngelmann, author = {Pfeifer, Tilo and Dussler, G and Engelmann, Bastian}, title = {Visualisierungsmethoden f{\"u}r Mikrostrukturen mit dem konfokalen Laser-Scanning-Mikroskop}, series = {VDI-Berichte}, journal = {VDI-Berichte}, pages = {175 -- 185}, language = {en} } @article{SchmittEngelmann, author = {Schmitt, Robert and Engelmann, Bastian}, title = {Keine Ermessensfrage!: Warum f{\"a}hige Messger{\"a}te wichtige Voraussetzung f{\"u}r Oberfl{\"a}chenoptimierungen sind}, series = {Metalloberfl{\"a}che}, volume = {59}, journal = {Metalloberfl{\"a}che}, number = {9}, pages = {39 -- 42}, language = {en} } @book{Engelmann, author = {Engelmann, Bastian}, title = {Entwicklung einer Systematik zur Modellierung oberfl{\"a}chenabh{\"a}ngiger Funktionseigenschaften}, publisher = {Shaker}, isbn = {978-3-8322-6558-8}, pages = {152}, language = {en} } @article{SchmittDriessenEngelmann, author = {Schmitt, Robert and Driessen, Sascha and Engelmann, Bastian}, title = {Controlling the assembly of micro systems by image processing}, series = {Microsystem technologies}, volume = {12}, journal = {Microsystem technologies}, pages = {640 -- 645}, language = {en} }