TY - JOUR A1 - Schmitt, Robert A1 - Hafner, Philip A1 - Engelmann, Bastian T1 - Strategies for the non-destructive characterization of thin layers with Scanning Acoustic Microscopy T2 - tm - Technisches Messen Y1 - 2007 UR - https://opus4.kobv.de/opus4-fhws/frontdoor/index/index/docId/3879 VL - 74 IS - 6 SP - 365 EP - 373 ER -