TY - CONF A1 - Baureis, Peter A1 - Gerber, J. T1 - Characterization and Modeling of Integrated Photosensors in Standard CMOS Technology T2 - Proceedings European Solid State Device Research Conference (ESSDERC 1996) Y1 - 1996 UR - https://opus4.kobv.de/opus4-fhws/frontdoor/index/index/docId/428 SP - 735 EP - 738 ER -